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Co-authors
(230)
Hitoshi Wakabayashi
23
Toyoji Yamamoto
17
Takemitsu Kunio
15
Koichi Takeuchi (竹内幸一)
13
Mitsuhiro Togo
13
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(9)
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Academic
Authors
Tohru Mogami
Tohru Mogami,NEC,Electrical & Electronic Engineering,Physics,Hardware & Architecture
Edit
Tohru Mogami
NEC
Publications:
95
|
Citations:
520
Fields:
Electrical & Electronic Engineering
,
Physics
,
Hardware & Architecture
View FAQ about top research areas and Fields of study
Collaborated with
230 co-authors
from 1988 to 2012
|
Cited by
1446 authors
Cumulative
Annual
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Publications
(95)
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HiSIM-RP: A reverse-profiling based 1st principles compact MOSFET model and its application to variability analysis of 90nm and 40nm CMOS
Hironori Sakamoto
,
Shigetaka Kumashiro
,
Shigeo Sato
,
Naoki Wakita
,
Tohru Mogami
Conference:
International Symposium on Quality Electronic Design - ISQED
, pp. 553-560, 2012
Study on Device Matrix Array structure for MOSFET gm variability evaluation
Kazuo Terada
,
Ryo Takeda
,
Katsuhiro Tsuji
,
Takaaki Tsunomura
,
Akio Nishida
,
Tohru Mogami
Conference:
IEEE International Conference on Microelectronic Test Structures - ICMTS
, pp. 73-76, 2012
Threshold voltage variation extracted from MOSFET CV curves by charge-based capacitance measurement
Katsuhiro Tsuji
,
Kazuo Terada
,
Ryo Takeda
,
Takaaki Tsunomura
,
Akio Nishida
,
Tohru Mogami
Conference:
IEEE International Conference on Microelectronic Test Structures - ICMTS
, pp. 82-86, 2012
On-Chip Single Tone Pseudo-Noise Generator for Analog IP Noise Tolerance Measurement
Masaaki Soda
,
Yoji Bando
,
Satoshi Takaya
,
Toru Ohkawa
,
Toshiharu Takaramoto
,
Toshio Yamada
,
Shigetaka Kumashiro
,
Tohru Mogami
,
Makoto Nagata
Published in 2011.
Three-Dimensional Structure Analysis of Metal--Oxide--Insulator Field Effect Transistors with Different Electrical Properties by Scanning Transmission Electron Microscopy
Shiano Ono
,
Miyuki Yamane
,
Hirohisa Okushima
,
Masanari Koguchi
,
Hiroyuki Shinada
,
Hiroshi Kakibayashi
,
Fumiko Yano
,
Takaaki Tsunomura
,
Akio Nishida
,
Tohru Mogami
Journal:
Applied Physics Express - APPL PHYS EXPRESS
, 2011
Sort by:
Citations
(520 times by 458 publications)
Reassessing the Mechanisms of Negative-Bias Temperature Instability by Repetitive Stress/Relaxation Experiments
(
Citations: 2
)
D. S. Ang
,
Z. Q. Teo
,
C. M. Ng
Journal:
IEEE Transactions on Device and Materials Reliability - IEEE TRANS DEVICE MATER RELIA
, vol. 11, no. 1, pp. 19-34, 2011
Transistor Mismatch Properties in Deep-Submicrometer CMOS Technologies
(
Citations: 1
)
Xiaobin Yuan
,
Takashi Shimizu
,
Umashankar Mahalingam
,
Jeffrey S. Brown
,
Kazi Z. Habib
,
Daniel G. Tekleab
,
Tai-Chi Su
,
Sarkar Satadru
,
C. Michael Olsen
,
Hyunwoo Lee
,
Li-Hong Pan
,
Terence B. Hook
http://academic.research.microsoft.com/io.ashx?type=5&id=51192643&selfId1=1081985&selfId2=0&maxNumber=12&query=
Journal:
IEEE Transactions on Electron Devices - IEEE TRANS ELECTRON DEVICES
, vol. 58, no. 2, pp. 335-342, 2011
Effect of Channel Dopant Profile on Difference in Threshold Voltage Variability Between NFETs and PFETs
(
Citations: 1
)
Takaaki Tsunomura
,
Akio Nishida
,
Toshiro Hiramoto
Journal:
IEEE Transactions on Electron Devices - IEEE TRANS ELECTRON DEVICES
, vol. 58, no. 2, pp. 364-369, 2011
On-chip detection methodology for break-even time of power gated function units
Kimiyoshi Usami
,
Yuya Goto
,
Kensaku Matsunaga
,
Satoshi Koyama
,
Daisuke Ikebuchi
,
Hideharu Amano
,
Hiroshi Nakamura
Conference:
International Symposium on Low Power Electronics and Design - ISLPED
, pp. 241-246, 2011
A 14GHz AC-Coupled Clock Distribution Scheme With Phase Averaging Technique Using Single LC-VCO and Distributed Phase Interpolators
Kiichi Niitsu
,
Vishal V. Kulkarni
,
Shinmo Kang
,
Hiroki Ishikuro
,
Tadahiro Kuroda
Journal:
IEEE Transactions on Very Large Scale Integration Systems - VLSI
, vol. 19, no. 11, pp. 2058-2066, 2011
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