Sign in
Author
|
Conference
|
Journal
|
Organization
|
Year
|
DOI
Look for results that meet for the following criteria:
since
equal to
before
between
and
Search in all fields of study
Limit my searches in the following fields of study
Agriculture Science
Arts & Humanities
Biology
Chemistry
Computer Science
Economics & Business
Engineering
Environmental Sciences
Geosciences
Material Science
Mathematics
Medicine
Physics
Social Science
Multidisciplinary
Co-authors
(123)
G. G. Fountain
10
R. A. Rudder
10
R. J. Markunas
10
Reiner Kraft
7
M. Rodder
6
Conferences
(4)
IEDM
11
DATE
1
VLSIT
1
IRPS
1
Journals
(7)
J VAC SCI TECHNOL A
9
J ELECTROCHEM SOC
4
ELECTRON LETT
3
MICROELECTRON ENG
2
Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures
2
Keywords
(78)
Embed
Subscribe
Academic
Authors
Sunil Hattangady
Sunil Hattangady,NEC,Electrical & Electronic Engineering,Nanotechnology,Hardware & Architecture
Edit
Sunil Hattangady
NEC
Publications:
37
|
Citations:
425
Fields:
Electrical & Electronic Engineering
,
Nanotechnology
,
Hardware & Architecture
View FAQ about top research areas and Fields of study
Collaborated with
123 co-authors
from 1987 to 2004
|
Cited by
1206 authors
Cumulative
Annual
Sort by:
Publications
(37)
BibTeX
|
RIS
|
RefWorks
Download
Security in embedded systems: Design challenges
(
Citations: 127
)
Srivaths Ravi
,
Anand Raghunathan
,
Paul C. Kocher
,
Sunil Hattangady
Journal:
ACM Transactions in Embedded Computing Systems - TECS
, vol. 3, no. 3, pp. 461-491, 2004
Securing Mobile Appliances: New Challenges for the System Designer
(
Citations: 20
)
Anand Raghunathan
,
Srivaths Ravi
,
Sunil Hattangady
,
Jean-Jacques Quisquater
Conference:
Design, Automation, and Test in Europe - DATE
, pp. 10176-10183, 2003
Extending the reliability scaling limit of SiO2 through plasma nitridation
(
Citations: 13
)
Paul E. Nicollian
,
Greg C. Baldwin
,
Kwame N. Eason
,
Douglas T. Grider
,
Sunil V. Hattangady
,
Jerry C. Hu
,
William R. Hunter
,
Mark Rodder
,
Antonio L. P. Rotondaro
Conference:
International Electron Devices Meeting - IEDM
, 2000
Depth Profile Analysis of Ultrathin Silicon Oxynitride Films by ToF-SIMS
(
Citations: 3
)
Monte A. Douglas
,
Sunil Hattangady
,
Kwame Eason
Journal:
Journal of The Electrochemical Society - J ELECTROCHEM SOC
, vol. 147, no. 5, 2000
Low voltage stress-induced-leakage-current in ultrathin gate oxides
(
Citations: 30
)
Paul E. Nicollian
,
Mark Rodder
,
Douglas T. Grider
,
Peijun Chen
,
Robert M. Wallace
,
Sunil V. Hattangady
Conference:
Reliability Physics, Annual International Symposium - IRPS
, 1999
Sort by:
Citations
(425 times by 390 publications)
Distributed Security for Communications and Memories in a Multiprocessor Architecture
(
Citations: 2
)
Pascal Cotret
,
Jeremie Crenne
,
Guy Gogniat
,
Jean-Philippe Diguet
,
Lubos Gaspar
,
Guillaume Duc
Published in 2011.
Embedded security for Internet of Things
(
Citations: 1
)
Arijit Ukil
,
Jaydip Sen
,
Sripad Koilakonda
Conference:
National Conference on Emerging Trends and Applications in Computer Science - NCETACS
, 2011
An Ontological Approach to Quantifying the Functional Flexibility of Embedded Systems
(
Citations: 2
)
Alan Stone
Journal:
IEEE Systems Journal - IEEE SYST J
, vol. 5, no. 1, pp. 111-120, 2011
The study of flat-band voltage shift using arsenic ion-implantation with High-k/Metal Inserted Poly Si gate stacks
BeomYong Kim
,
YunHyuck Ji
,
SeungMi Lee
,
BongSeok Jeon
,
KeeJeung Lee
,
Kwon Hong
,
SungKi Park
Conference:
Solid-State Device Research European Conference - ESSDERC
, pp. 79-82, 2011
A clustering algorithm for negotiating security in wireless mesh networks
N. Botezatu
,
V. Manta
,
G. Vieriu
Published in 2011.
Comments