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Co-authors
(27)
Tibor Grasser
8
Stanislav Tyaginov
8
Hubert Enichlmair
6
Hajdin Ceric
6
Christoph Jungemann
4
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Authors
Ivan Starkov
Ivan Starkov,Vienna University of Technology,Algorithms & Theory,Physics,Electrical & Electronic Engineering
Edit
Ivan Starkov
Vienna University of Technology
Publications:
11
|
Citations:
7
Fields:
Algorithms & Theory
,
Physics
,
Electrical & Electronic Engineering
View FAQ about top research areas and Fields of study
Collaborated with
27 co-authors
from 2009 to 2012
|
Cited by
9 authors
Cumulative
Annual
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Publications
(11)
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RefWorks
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Impact of the Pyroelectric Effect on Ferroelectric Phase Transitions
Alexander Starkov
,
Oleg Pakhomov
,
Ivan Starkov
Journal:
Ferroelectrics
, vol. 427, no. 1, pp. 78-83, 2012
Solid-State Cooler: New Opportunities
Alexander Starkov
,
Oleg Pakhomov
,
Ivan Starkov
Journal:
Ferroelectrics
, vol. 430, no. 1, pp. 108-114, 2012
Secondary generated holes as a crucial component for modeling of HC degradation in high-voltage n-MOSFET
(
Citations: 2
)
Stanislav Tyaginov
,
Ivan Starkov
,
Oliver Triebl
,
Hajdin Ceric
,
Tibor Grasser
,
Hubert Enichlmair
,
Jong-Mun Park
,
Christoph Jungemann
Conference:
International Conference on Simulation of Semiconductor Processes and Devices - SISPAD
, pp. 123-126, 2011
Temperature hysteresis of the capacitance dependence C(T) for ferroelectric ceramics
(
Citations: 1
)
Antonina Dedyk
,
Yulia Pavlova
,
Sergey Karmanenko
,
Alexander Semenov
,
Dmitry Semikin
,
Oleg Pakhomov
,
Alexander Starkov
,
Ivan Starkov
Journal:
Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures
, vol. 29, 2011
An analytical approach for physical modeling of hot-carrier induced degradation
S. Tyaginov
,
I. Starkov
,
H. Enichlmair
,
Ch. Jungemann
,
J. M. Park
,
E. Seebacher
,
R. Orio
,
H. Ceric
,
T. Grasser
Journal:
Microelectronics Reliability
, vol. 51, no. 9, pp. 1525-1529, 2011
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Citations
(7 times by 5 publications)
Impact of the Pyroelectric Effect on Ferroelectric Phase Transitions
Alexander Starkov
,
Oleg Pakhomov
,
Ivan Starkov
Journal:
Ferroelectrics
, vol. 427, no. 1, pp. 78-83, 2012
Secondary generated holes as a crucial component for modeling of HC degradation in high-voltage n-MOSFET
(
Citations: 2
)
Stanislav Tyaginov
,
Ivan Starkov
,
Oliver Triebl
,
Hajdin Ceric
,
Tibor Grasser
,
Hubert Enichlmair
,
Jong-Mun Park
,
Christoph Jungemann
Conference:
International Conference on Simulation of Semiconductor Processes and Devices - SISPAD
, pp. 123-126, 2011
Analysis of worst-case hot-carrier degradation conditions in the case of n- and p-channel high-voltage MOSFETs
Ivan Starkov
,
Hajdin Ceric
,
Stanislav Tyaginov
,
Tibor Grasser
,
Hubert Enichlmair
,
Jong-Mun Park
,
Christoph Jungemann
Conference:
International Conference on Simulation of Semiconductor Processes and Devices - SISPAD
, pp. 127-130, 2011
Impact of the carrier distribution function on hot-carrier degradation modeling
Stanislav Tyaginov
,
Ivan Starkov
,
Christoph Jungemann
,
Hubert Enichlmair
,
Jong-Mun Park
,
Tibor Grasser
Conference:
Solid-State Device Research European Conference - ESSDERC
, pp. 151-154, 2011
Analysis of worst-case hot-carrier conditions for n-type MOSFET
Ivan Starkov
,
Hajdin Ceric
,
Stanislav Tyaginov
,
Tibor Grasser
Conference:
Research in Microelectronics and Electronics Ph.D - PRIME
, 2011
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