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Co-authors
(41)
Jaap Beerens
4
J. C. Portal
4
Luc De Schepper
3
Sarah Ben Amor
3
A. Touboul
3
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(3)
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1
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1
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Academic
Authors
Guy Gregoris
Guy Gregoris,Centre Universitaire de Formation et de Recherche Jean Francois Champollion,Algorithms & Theory,Software Engineering,Electrical & Electro
Edit
Guy Gregoris
Centre Universitaire de Formation et de Recherche Jean Francois Champollion
Publications:
14
|
Citations:
17
Fields:
Algorithms & Theory
,
Software Engineering
,
Electrical & Electronic Engineering
View FAQ about top research areas and Fields of study
Collaborated with
41 co-authors
from 1984 to 1997
|
Cited by
63 authors
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Annual
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Publications
(14)
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Ga As power mmic: A design methodology for reliability
(
Citations: 6
)
J. L. Muraro
,
F. Coppel
,
G. Gregoris
,
P. G. Tizien
,
J. L. Roux
Journal:
Microelectronics Reliability
, vol. 37, no. 10, pp. 1651-1654, 1997
How MMIC Technology is Improving Satellite Transponders
(
Citations: 2
)
Jean-Louis Cazaux
,
Guy Gregoris
,
Michel Pouysegur
,
Michel Soulard
Conference:
Microwave, European Conference - EuMC
, 1997
In-situ study of the degradation behaviour of GaAs MESFETs for hi-rel applications
(
Citations: 1
)
R. Petersen
,
W. de Ceuninck
,
L. de Schepper
,
G. Grégoris
Journal:
Microelectronics Reliability
, vol. 37, no. 10, pp. 1655-1658, 1997
EVALUATION ON A TWO‐DAY TIME SCALE OF HIGH‐RELIABILITY ELECTRONIC ASSEMBLIES BY INSITU ELECTRICAL AND OPTO‐MECHANICAL TEST TECHNIQUES
(
Citations: 1
)
G. GREGORIS
,
F. BOUTON
,
C. DE KEUKELEIRE
,
P. SILIPRANDI
,
F. BAIO
,
L. DE SCHEPPER
,
W. DE CEUNINCK
,
L. TIELEMANS
,
T. AHRENS
,
M. KRUMM
Journal:
Quality and Reliability Engineering International
, vol. 12, no. 4, pp. 247-252, 1996
EVALUATION ON A TWO-DAY TIME SCALE OF HIGH-RELIABILITY ELECTRONIC ASSEMBLIES BYIN-SITU ELECTRICAL AND OPTO-MECHANICAL TEST TECHNIQUES
G. GREGORIS
,
F. BOUTON
,
C. DE KEUKELEIRE
,
P. SILIPRANDI
,
F. BAIO
,
L. DE SCHEPPER
,
W. DE CEUNINCK
,
L. TIELEMANS
,
T. AHRENS
,
M. KRUMM
Journal:
Quality and Reliability Engineering International
, vol. 12, no. 4, pp. 247-252, 1996
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Citations
(17 times by 17 publications)
Hydrostatic pressure and electric field effects on thenormalized binding energy in asymmetrical quantumwells
E. C. Niculescu
,
N. Eseanu
Journal:
European Physical Journal B - EUR PHYS J B
, vol. 75, no. 2, pp. 247-251, 2010
Reliability of SiGe HBTs for Power Amplifiers—Part I: Large-Signal RF Performance and Operating Limits
(
Citations: 1
)
Curtis M. Grens
,
Peng Cheng
,
John D. Cressler
Journal:
IEEE Transactions on Device and Materials Reliability - IEEE TRANS DEVICE MATER RELIA
, vol. 9, no. 3, pp. 431-439, 2009
Prospective and issues for GaN microwave electronics into space satellites
(
Citations: 2
)
Jean-Louis Cazaux
,
Stéphane Forestier
,
Jean-François Villemazet
,
Olivier Vendier
,
Chloé Schaffauser
,
Claude Drevon
,
Jean-Luc Muraro
Conference:
Microwave , Asia-Pacific Conference - APMC
, 2006
Safe operating area of GaAs MESFET for nonlinear applications
Nathalie Malbert
,
Nathalie Labat
,
Naoufel Ismail
,
André Touboul
,
Jean-Luc Muraro
,
Francis Brasseau
,
Dominique Langrez
Journal:
IEEE Transactions on Device and Materials Reliability - IEEE TRANS DEVICE MATER RELIA
, vol. 6, no. 2, pp. 221-227, 2006
On-state safe operating area of GaAs MESFET defined for non linear applications
N. Ismail
,
N. Malbert
,
N. Labat
,
A. Touboul
,
J.-L. Muraro
,
F. Brasseau
,
D. Langrez
Published in 2005.
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