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Co-authors
(188)
Calogero Pace
43
Gino Giusi
31
Guido Groeseneken
26
Salvatore A Lombardo
25
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23
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Academic
Authors
Felice Crupi
Felice Crupi,Università della Calabria,Electrical & Electronic Engineering,Nanotechnology,Algorithms & Theory
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Felice Crupi
Università della Calabria
Publications:
121
|
Citations:
380
Fields:
Electrical & Electronic Engineering
,
Nanotechnology
,
Algorithms & Theory
View FAQ about top research areas and Fields of study
Collaborated with
188 co-authors
from 1998 to 2012
|
Cited by
841 authors
Cumulative
Annual
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Publications
(121)
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Superior reliability and reduced Time-Dependent variability in high-mobility SiGe channel pMOSFETs for VLSI logic applications
J. Franco
,
B. Kaczer
,
J. Mitard
,
M. Toledano-Luque
,
F. Crupi
,
G. Eneman
,
Ph. J. Rousse
,
T. Grasser
,
M. Cho
,
T. Kauerauf
,
L. Witters
,
G. Hellings
http://academic.research.microsoft.com/io.ashx?type=5&id=56984024&selfId1=12623776&selfId2=0&maxNumber=12&query=
Conference:
IEEE International Conference on Integrated Circuit Design and Technology - ICICDT
, 2012
Buried Silicon-Germanium pMOSFETs: Experimental Analysis in VLSI Logic Circuits Under Aggressive Voltage Scaling
Felice Crupi
,
Massimo Alioto
,
Jacopo Franco
,
Paolo Magnone
,
Ben Kaczer
,
Guido Groeseneken
,
Jérôme Mitard
,
Liesbeth Witters
,
Thomas Y. Hoffmann
Journal:
IEEE Transactions on Very Large Scale Integration Systems - VLSI
, vol. 20, no. 8, pp. 1487-1495, 2012
Understanding the Potential and the Limits of Germanium pMOSFETs for VLSI Circuits From Experimental Measurements
(
Citations: 3
)
P. Magnone
,
F. Crupi
,
M. Alioto
,
B. Kaczer
,
B. De Jaeger
Journal:
IEEE Transactions on Very Large Scale Integration Systems - VLSI
, vol. 19, no. 9, pp. 1569-1582, 2011
Criticisms on and comparison of experimental channel backscattering extraction methods
(
Citations: 2
)
Gino Giusi
,
Felice Crupi
,
Paolo Magnone
Journal:
Microelectronic Engineering - MICROELECTRON ENG
, vol. 88, no. 1, pp. 76-81, 2011
A 2.6 nW, 0.45 V Temperature-Compensated Subthreshold CMOS Voltage Reference
(
Citations: 1
)
Luca Magnelli
,
Felice Crupi
,
Pasquale Corsonello
,
Calogero Pace
,
Giuseppe Iannaccone
Journal:
IEEE Journal of Solid-state Circuits - IEEE J SOLID-STATE CIRCUITS
, vol. 46, no. 2, pp. 465-474, 2011
Sort by:
Citations
(380 times by 298 publications)
Understanding the Potential and the Limits of Germanium pMOSFETs for VLSI Circuits From Experimental Measurements
(
Citations: 3
)
P. Magnone
,
F. Crupi
,
M. Alioto
,
B. Kaczer
,
B. De Jaeger
Journal:
IEEE Transactions on Very Large Scale Integration Systems - VLSI
, vol. 19, no. 9, pp. 1569-1582, 2011
Low-frequency noise in triple-gate n-channel bulk FinFETs
(
Citations: 1
)
E. Simoen
,
M. Aoulaiche
,
N. Collaert
,
C. Claeys
Conference:
International Conference on Noise and Fluctuations - ICNF
, 2011
On the recoverable and permanent components of Hot Carrier and NBTI in Si pMOSFETs and their implications in Si0.45Ge0.55 pMOSFETs
(
Citations: 1
)
J. Franco
,
B. Kaczer
,
G. Eneman
,
Ph. J. Roussel
,
M. Cho
,
J. Mitard
,
L. Witters
,
T. Y. Hoffmann
,
G. Groeseneken
,
F. Crupi
,
T. Grasser
Published in 2011.
A physics-based model of the dielectric breakdown in HfO2 for statistical reliability prediction
(
Citations: 1
)
Luca Vandelli
,
Andrea Padovani
,
Luca Larcher
,
Gennadi Bersuker
,
Jung Yum
,
Paolo Pavan
Published in 2011.
A microscopically accurate model of partially ballistic nanoMOSFETs in saturation based on channel backscattering
(
Citations: 1
)
Gino Giusi
,
Giuseppe Iannaccone
,
Felice Crupi
Journal:
IEEE Transactions on Electron Devices - IEEE TRANS ELECTRON DEVICES
, vol. 58, no. 3, pp. 691-697, 2011
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