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Co-authors
(97)
Hyun-Sang Hwang
67
Joonmyoung Lee
44
Seong-Hyun Kim
36
Minseok Jo
30
Wootae Lee
29
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(6)
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Academic
Authors
Seung-Jae Jung
Seung-Jae Jung,Gwangju Institute of Science & Technology,Electrical & Electronic Engineering,Nanotechnology,Chemical Physics & Material Physics
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Seung-Jae Jung
Gwangju Institute of Science & Technology
Publications:
71
|
Citations:
35
Fields:
Electrical & Electronic Engineering
,
Nanotechnology
,
Chemical Physics & Material Physics
View FAQ about top research areas and Fields of study
Collaborated with
97 co-authors
from 2007 to 2012
|
Cited by
107 authors
Cumulative
Annual
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Publications
(71)
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Operation Voltage Control in Complementary Resistive Switches Using Heterodevice
Daeseok Lee
,
Seungjae Jung
,
Godeuni Choi
,
Joonmyoung Lee
,
Seonghyun Kim
,
Jiyong Woo
,
Manzar Siddik
,
Eujun Cha
,
Hyunsang Hwang
Journal:
IEEE Electron Device Letters - IEEE ELECTRON DEV LETT
, vol. 33, no. 4, pp. 600-602, 2012
Self-Selective Characteristics of Nanoscale $ \hbox{VO}_{x}$ Devices for High-Density ReRAM Applications
Myungwoo Son
,
Xinjun Liu
,
Daeseok Lee
,
Wootae Lee
,
Seonghyun Kim
,
Jungho Shin
,
Seungjae Jung
,
Moon-Ho Ham
,
Hyunsang Hwang
Journal:
IEEE Electron Device Letters - IEEE ELECTRON DEV LETT
, vol. 33, no. 5, pp. 718-720, 2012
In-Depth Study on the Effect of Active-Area Scale-Down of Solution-Processed $\hbox{TiO}_{x}$
Seungjae Jung
,
Jaemin Kong
,
Tae-Wook Kim
,
Sunghoon Song
,
Kwanghee Lee
,
Takhee Lee
,
Hyunsang Hwang
,
Sanghun Jeon
Journal:
IEEE Electron Device Letters - IEEE ELECTRON DEV LETT
, vol. 33, no. 6, pp. 869-871, 2012
Defect engineering: reduction effect of hydrogen atom impurities in HfO2-based resistive-switching memory devices
Seonghyun Kim
,
Daeseok Lee
,
Seungjae Jung
,
Wootae Lee
,
Jungho Shin
,
Jiyong Woo
,
Godeuni Choi
,
Hyunsang Hwang
Journal:
Nanotechnology - NANOTECHNOL
, vol. 23, no. 32, 2012
Improved Switching Variability and Stability by Activating a Single Conductive Filament
Seungjae Jung
,
Wootae Lee
,
Seonghyun Kim
,
Jungho Shin
,
Daeseok Lee
,
Jiyong Woo
,
Hyunsang Hwang
Journal:
IEEE Electron Device Letters - IEEE ELECTRON DEV LETT
, vol. 33, no. 5, pp. 646-648, 2012
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Citations
(35 times by 30 publications)
New Set/Reset Scheme for Excellent Uniformity in Bipolar Resistive Memory
(
Citations: 1
)
Minseok Jo
,
Seungjae Jung
,
Joonmyoung Lee
,
Wootae Lee
,
Seonghyun Kim
,
Jungho Shin
,
Hyunsang Hwang
Journal:
IEEE Electron Device Letters - IEEE ELECTRON DEV LETT
, vol. 32, no. 3, pp. 228-230, 2011
Ultralow Switching Energy Ni/$\hbox{GeO}_{x}$ /HfON/TaN RRAM
(
Citations: 1
)
C. H. Cheng
,
Albert Chin
,
F. S. Yeh
Journal:
IEEE Electron Device Letters - IEEE ELECTRON DEV LETT
, vol. 32, no. 3, pp. 366-368, 2011
Universal Reset Characteristics of Unipolar and Bipolar Metal-Oxide RRAM
(
Citations: 1
)
Daniele Ielmini
,
Federico Nardi
,
Carlo Cagli
Journal:
IEEE Transactions on Electron Devices - IEEE TRANS ELECTRON DEVICES
, vol. 58, no. 10, pp. 3246-3253, 2011
Low Reset Current in Stacked $\hbox{AlO}_{x}/ \hbox{WO}_{x}$ Resistive Switching Memory
Y. L. Song
,
Y. Liu
,
Y. L. Wang
,
M. Wang
,
X. P. Tian
,
L. M. Yang
,
Y. Y. Lin
Journal:
IEEE Electron Device Letters - IEEE ELECTRON DEV LETT
, vol. 32, no. 10, pp. 1439-1441, 2011
An Accurate Two-Port De-Embedding Technique for RF/Millimeter-Wave Noise Characterization and Modeling of Deep Submicrometer Transistors
Xi Sung Loo
,
Kiat Seng Yeo
,
Kok Wai J. Chew
,
Lye Hock Kelvin Chan
,
Shih Ni Ong
,
Manh Anh Do
,
Chirn Chye Boon
Journal:
IEEE Transactions on Microwave Theory and Techniques - IEEE TRANS MICROWAVE THEORY
, vol. 59, no. 2, pp. 479-487, 2011
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