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Co-authors
(51)
Ding-Ming Kwai
18
Cheng-Wen Wu
17
Kuo-liang Cheng
6
Chih-tsun Huang (黃稚存)
5
Chih-wea Wang
4
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(17)
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4
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Authors
Yung-Fa Chou
Yung-Fa Chou,Industrial Technology Research Institute of Taiwan,Hardware & Architecture,Engineering,Software Engineering
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Yung-Fa Chou
Industrial Technology Research Institute of Taiwan
Publications:
28
|
Citations:
68
Fields:
Hardware & Architecture
,
Engineering
,
Software Engineering
View FAQ about top research areas and Fields of study
Collaborated with
51 co-authors
from 1994 to 2011
|
Cited by
137 authors
Cumulative
Annual
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Publications
(28)
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Realization of virtual 126-core system with thermal sensor-network using metallic thermal skeletons
Jui-Hung Chien
,
Chiao-Ling Lung
,
Kun-Ju Tsai
,
Chin-Chi Hsu
,
Ting-Sheng Chen
,
Yung-Fa Chou
,
Ping-Hei Chen
,
Shih-Chieh Chang
,
Ding-Ming Kwai
Conference:
Electronic Components and Technology Conference - ECTC
, pp. 873-879, 2011
Design and implementation of 3D-thermal test chip for exploration of package effects
Jui-Hung Chien
,
Chiao-Ling Lung
,
Ta-Wei Lin
,
Kun-Ju Tsai
,
Ting-Sheng Chen
,
Yung-Fa Chou
,
Ping-Hei Chen
,
Shih-Chieh Chang
,
Ding-Ming Kwai
Conference:
International Microsystems, Packaging, Assembly and Circuits Technology - IMPACT
, pp. 238-241, 2011
A self-testing and calibration method for embedded successive approximation register ADC
Xuan-Lun Huang
,
Ping-Ying Kang
,
Jiun-Lang Huang
,
Yung-Fa Chou
,
Yung-Pin Lee
,
Ding-Ming Kwai
,
Cheng-Wen Wu
Conference:
Asia and South Pacific Design Automation Conference - ASP-DAC
, pp. 713-718, 2011
A built-in self-test scheme for the post-bond test of TSVs in 3D ICs
Yu-Jen Huang
,
Jin-Fu Li
,
Ji-Jan Chen
,
Ding-Ming Kwai
,
Yung-Fa Chou
,
Cheng-Wen Wu
Conference:
IEEE VLSI Test Symposium - VTS
, pp. 20-25, 2011
A Pre and Post-bond Self-Testing and Calibration Methodology for SAR ADC Array in 3-D CMOS Imager
Xuan-Lun Huang
,
Ping-Ying Kang
,
Jiun-Lang Huang
,
Yung-Fa Chou
,
Yung-Pin Lee
,
Ding-Ming Kwai
Conference:
European Test Symposium - ETS
, pp. 39-44, 2011
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Citations
(68 times by 54 publications)
An efficient fault detection algorithm for NAND flash memory
Tei-Wei Kuo
,
Po-Chun Huang
,
Yuan-Hao Chang
,
Chia-Ling Ko
,
Chih-Wen Hsueh
Journal:
ACM Sigapp Applied Computing Review
, pp. 8-16, 2011
A built-in self-test scheme for the post-bond test of TSVs in 3D ICs
Yu-Jen Huang
,
Jin-Fu Li
,
Ji-Jan Chen
,
Ding-Ming Kwai
,
Yung-Fa Chou
,
Cheng-Wen Wu
Conference:
IEEE VLSI Test Symposium - VTS
, pp. 20-25, 2011
A Built-in Self-Diagnosis and Repair Design With Fail Pattern Identification for Memories
Chin-Lung Su
,
Rei-Fu Huang
,
Cheng-Wen Wu
,
Kun-Lun Luo
,
Wen-Ching Wu
Journal:
IEEE Transactions on Very Large Scale Integration Systems - VLSI
, vol. 19, no. 12, pp. 2184-2194, 2011
A Low-Power Electronic Nose Signal-Processing Chip for a Portable Artificial Olfaction System
Kea-Tiong Tang
,
Shih-Wen Chiu
,
Meng-Fan Chang
,
Chih-Cheng Hsieh
,
Jyuo-Min Shyu
Journal:
IEEE Transactions on Biomedical Circuits and Systems - IEEE TRANS BIOMED CIRCUITS SY
, vol. 5, no. 4, pp. 380-390, 2011
Genetic Defect Based March Test Generation for SRAM
Stefano Di Carlo
,
Gianfranco Politano
,
Paolo Prinetto
,
Alessandro Savino
,
Alberto Scionti
Conference:
EvoWorkshops
, pp. 141-150, 2011
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