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Co-authors
(143)
Ronald D. Schrimpf
35
Hugh J. Barnaby
29
Daniel M. Fleetwood
23
Dale G. Platteter
22
Gary W. Dunham
21
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Academic
Authors
Ronald L. Pease
Ronald L. Pease,University of New Mexico,Nuclear Engineering,Radiation,Electrical & Electronic Engineering
Edit
Ronald L. Pease
University of New Mexico
Publications:
104
|
Citations:
805
Fields:
Nuclear Engineering
,
Radiation
,
Electrical & Electronic Engineering
View FAQ about top research areas and Fields of study
Collaborated with
143 co-authors
from 1991 to 2011
|
Cited by
797 authors
Cumulative
Annual
Sort by:
Publications
(104)
BibTeX
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RefWorks
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Enhanced Low Dose Rate Sensitivity at Ultra-Low Dose Rates
Dakai Chen
,
Ronald Pease
,
Kirby Kruckmeyer
,
James Forney
,
Anthony Phan
,
Martin Carts
,
Stephen Cox
,
Sam Burns
,
Rafi Albarian
,
Bruce Holcombe
,
Bradley Little
,
James Salzman
http://academic.research.microsoft.com/io.ashx?type=5&id=56945768&selfId1=1583013&selfId2=0&maxNumber=12&query=
Journal:
IEEE Transactions on Nuclear Science - IEEE TRANS NUCL SCI
, vol. 58, no. 6, pp. 2983-2990, 2011
Modeling Low Dose Rate Effects in Shallow Trench Isolation Oxides
Ivan S. Esqueda
,
Hugh J. Barnaby
,
Philippe C. Adell
,
Bernard G. Rax
,
Harold P. Hjalmarson
,
Michael L. McLain
,
Ronald L. Pease
Journal:
IEEE Transactions on Nuclear Science - IEEE TRANS NUCL SCI
, vol. 58, no. 6, pp. 2945-2952, 2011
The Effects of ELDRS at Ultra-Low Dose Rates
(
Citations: 2
)
Dakai Chen
,
James D. Forney
,
Ronald L. Pease
,
Anthony M. Phan
,
Martin A. Carts
,
Stephen R. Cox
,
Kirby Kruckmeyer
,
Sam Burns
,
Rafi Albarian
,
Bruce Holcombe
,
B. Little
,
J. Salzman
http://academic.research.microsoft.com/io.ashx?type=5&id=50974268&selfId1=1583013&selfId2=0&maxNumber=12&query=
Conference:
IEEE Radiation Effects Data Workshop - REDW
, pp. 6-6, 2010
Evaluation of an Accelerated ELDRS Test Using Molecular Hydrogen
Ronald L. Pease
,
Philippe C. Adell
,
Bernard Rax
,
Steven McClure
,
Hugh J. Barnaby
,
Kirby Kruckmeyer
,
B. Triggs
Journal:
IEEE Transactions on Nuclear Science - IEEE TRANS NUCL SCI
, vol. 57, no. 6, pp. 3419-3425, 2010
ELDRS in Bipolar Linear Circuits: A Review
(
Citations: 14
)
Ronald L. Pease
,
Ronald D. Schrimpf
,
Daniel M. Fleetwood
Journal:
IEEE Transactions on Nuclear Science - IEEE TRANS NUCL SCI
, vol. 56, no. 4, pp. 1894-1908, 2009
Sort by:
Citations
(805 times by 370 publications)
Accurate Modeling of Single-Event Transients in a SiGe Voltage Reference Circuit
(
Citations: 2
)
Kurt A. Moen
,
Laleh Najafizadeh
,
Jung Seungwoo
,
Ashok Raman
,
Marek Turowski
,
John D. Cressler
Journal:
IEEE Transactions on Nuclear Science - IEEE TRANS NUCL SCI
, vol. 58, no. 3, pp. 877-884, 2011
Direct Comparison of Charge Collection in SOI Devices From Single-Photon and Two-Photon Laser Testing Techniques
James R. Schwank
,
Marty R. Shaneyfelt
,
Paul E. Dodd
,
Dale McMorrow
,
Gyorgy Vizkelethy
,
Véronique Ferlet-Cavrois
,
Pascale M. Gouker
,
Richard S. Flores
,
Jeffrey Stevens
,
Stephen B. Buchner
,
Scott M. Dalton
,
Scot E. Swanson
Journal:
IEEE Transactions on Nuclear Science - IEEE TRANS NUCL SCI
, vol. 58, no. 3, pp. 820-826, 2011
Impact of Switched Dose-Rate Irradiation on the Response of the LM124 Operational Amplifier to Pulsed X-Rays
Nicolas J.-H. Roche
,
Laurent Dusseau
,
Julien Mekki
,
Stephanie Perez
,
Jean-Roch Vaille
,
Yago Gonzalez Velo
,
Jérome Boch
,
Frédéric Saigne
,
Ronan Marec
,
Philippe Calvel
,
Francoise Bezerra
,
Gérard Auriel
http://academic.research.microsoft.com/io.ashx?type=5&id=51183916&selfId1=1583013&selfId2=0&maxNumber=12&query=
Journal:
IEEE Transactions on Nuclear Science - IEEE TRANS NUCL SCI
, vol. 58, no. 3, pp. 960-968, 2011
Layout-Aware Multi-Cell Upsets Effects Analysis on TMR Circuits Implemented on SRAM-Based FPGAs
Luca Sterpone
,
Massimo Violante
,
Alessandro Panariti
,
A. Bocquillon
,
Florent Miller
,
Nadine Buard
,
Andrea Manuzzato
,
Simone Gerardin
,
Alessandro Paccagnella
Journal:
IEEE Transactions on Nuclear Science - IEEE TRANS NUCL SCI
, vol. 58, no. 5, pp. 2325-2332, 2011
The Use of Electron-Beam Lithography for Localized MicroBeam Irradiations
Y. Gonzalez-Velo
,
J. Boch
,
F. Pichot
,
J. Mekki
,
N. J.-H. Roche
,
S. Perez
,
C. Deneau
,
J.-R. Vaille
,
L. Dusseau
,
F. Saigne
,
E. Lorfevre
,
R. D. Schrimpf
Journal:
IEEE Transactions on Nuclear Science - IEEE TRANS NUCL SCI
, vol. 58, no. 3, pp. 1104-1111, 2011
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