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Herman E. Maes

Herman E. Maes,Catholic University of Leuven,Electrical & Electronic Engineering,Nanotechnology,Algorithms & Theory

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Herman E. Maes

Catholic University of Leuven

Publications: 317 | Citations: 2836

Fields: Electrical & Electronic Engineering, Nanotechnology, Algorithms & Theory

Collaborated with 397 co-authors from 1973 to 2009 | Cited by 5365 authors

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Publications (317)

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Impact of nitridation on recoverable and permanent negative bias temperature instability degradation in high-k/metal-gate p-type metal oxide semiconductor field effect transistors (Citations: 2)

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Journal: Journal of Vacuum Science & Technology B - J VAC SCI TECHNOL B , vol. 27, no. 1, 2009

Velocity and Mobility Investigation in 1-nm-EOT HfSiON on Si (110) and (100)—Does the Dielectric Quality Matter? (Citations: 2)

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Journal: IEEE Transactions on Electron Devices - IEEE TRANS ELECTRON DEVICES , vol. 56, no. 12, pp. 3009-3017, 2009

Quantized logic switch implementation through a superconducting transformer

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Conference: International Conference on Ultimate Integration of Silicon - ULIS , 2009

On the Correct Extraction of Interface Trap Density of MOS Devices With High-Mobility Semiconductor Substrates (Citations: 48)

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Journal: IEEE Transactions on Electron Devices - IEEE TRANS ELECTRON DEVICES , vol. 55, no. 2, pp. 547-556, 2008

Physical understanding and modeling of SANOS retention in programmed state (Citations: 7)

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Journal: Solid-state Electronics - SOLID STATE ELECTRON , vol. 52, no. 4, pp. 577-583, 2008

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Citations (2836 times by 2163 publications)

Reliability study of ultra-thin dielectric films with variable thickness levels

Journal: Iie Transactions , vol. 44, no. 9, pp. 744-753, 2012

Understanding the Potential and the Limits of Germanium pMOSFETs for VLSI Circuits From Experimental Measurements (Citations: 3)

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Journal: IEEE Transactions on Very Large Scale Integration Systems - VLSI , vol. 19, no. 9, pp. 1569-1582, 2011

An Array-Based Test Circuit for Fully Automated Gate Dielectric Breakdown Characterization (Citations: 3)

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Journal: IEEE Transactions on Very Large Scale Integration Systems - VLSI , vol. 19, no. 5, pp. 787-795, 2011

A Comprehensive LER-Aware TDDB Lifetime Model for Advanced Cu Interconnects (Citations: 2)

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Journal: IEEE Transactions on Device and Materials Reliability - IEEE TRANS DEVICE MATER RELIA , vol. 11, no. 2, pp. 278-289, 2011

Overview on ESD Protection Designs of Low-Parasitic Capacitance for RF ICs in CMOS Technologies (Citations: 1)

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Journal: IEEE Transactions on Device and Materials Reliability - IEEE TRANS DEVICE MATER RELIA , vol. 11, no. 2, pp. 207-218, 2011

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Co-authors (397)

Conferences (16)

Journals (44)

Keywords (362)

Herman E. Maes,Catholic University of Leuven,Electrical & Electronic Engineering,Nanotechnology,Algorithms & Theory

Publications (317)

BibTeX | RIS | RefWorks Download

Impact of nitridation on recoverable and permanent negative bias temperature instability degradation in high-k/metal-gate p-type metal oxide semiconductor field effect transistors (Citations: 2)

Velocity and Mobility Investigation in 1-nm-EOT HfSiON on Si (110) and (100)—Does the Dielectric Quality Matter? (Citations: 2)

Quantized logic switch implementation through a superconducting transformer

On the Correct Extraction of Interface Trap Density of MOS Devices With High-Mobility Semiconductor Substrates (Citations: 48)

Physical understanding and modeling of SANOS retention in programmed state (Citations: 7)

Citations (2836 times by 2163 publications)

Reliability study of ultra-thin dielectric films with variable thickness levels

Understanding the Potential and the Limits of Germanium pMOSFETs for VLSI Circuits From Experimental Measurements (Citations: 3)

An Array-Based Test Circuit for Fully Automated Gate Dielectric Breakdown Characterization (Citations: 3)

A Comprehensive LER-Aware TDDB Lifetime Model for Advanced Cu Interconnects (Citations: 2)

Overview on ESD Protection Designs of Low-Parasitic Capacitance for RF ICs in CMOS Technologies (Citations: 1)


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Co-authors (397)

Conferences (16)

Journals (44)

Keywords (362)

Herman E. Maes,Catholic University of Leuven,Electrical & Electronic Engineering,Nanotechnology,Algorithms & Theory

Publications (317) BibTeX | RIS | RefWorks Download

Impact of nitridation on recoverable and permanent negative bias temperature instability degradation in high-k/metal-gate p-type metal oxide semiconductor field effect transistors (Citations: 2)

Velocity and Mobility Investigation in 1-nm-EOT HfSiON on Si (110) and (100)—Does the Dielectric Quality Matter? (Citations: 2)

Quantized logic switch implementation through a superconducting transformer

On the Correct Extraction of Interface Trap Density of MOS Devices With High-Mobility Semiconductor Substrates (Citations: 48)

Physical understanding and modeling of SANOS retention in programmed state (Citations: 7)

Citations (2836 times by 2163 publications)

Reliability study of ultra-thin dielectric films with variable thickness levels

Understanding the Potential and the Limits of Germanium pMOSFETs for VLSI Circuits From Experimental Measurements (Citations: 3)

An Array-Based Test Circuit for Fully Automated Gate Dielectric Breakdown Characterization (Citations: 3)

A Comprehensive LER-Aware TDDB Lifetime Model for Advanced Cu Interconnects (Citations: 2)

Overview on ESD Protection Designs of Low-Parasitic Capacitance for RF ICs in CMOS Technologies (Citations: 1)

Publications (317)

BibTeX | RIS | RefWorks Download