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(138)
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32
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Thomas Zimmermann
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Thomas Zimmermann
Microsoft
Publications: 139
|
Citations: 1949
|
G-Index: 43
|
H-Index: 23
The information is calculated based on the tens of millions of scholarly articles currently discoverable within Microsoft Academic Search. As more content gets indexed, the accuracy and completeness will continue to improve.
Interests:
Software Engineering
,
Programming Languages
,
Mechanical Engineering
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Collaborated with
138 co-authors
from 1998 to 2011
; Cited by
1728 authors
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(139)
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Empirical software engineering at Microsoft Research
(
Citations: 1
)
Christian Bird
,
Brendan Murphy
,
Nachiappan Nagappan
,
Thomas Zimmermann
Conference:
Conference on Computer Supported Cooperative Work - CSCW
, pp. 143-150, 2011
"Not my bug!" and other reasons for software bug report reassignments
Philip J. Guo
,
Thomas Zimmermann
,
Nachiappan Nagappan
,
Brendan Murphy
Conference:
Conference on Computer Supported Cooperative Work - CSCW
, pp. 395-404, 2011
Barrier height, interface charge & tunneling effective mass in ALD Al2O3/AlN/GaN HEMTs
Satyaki Ganguly
,
Jai Verma
,
Guowang Li
,
Tom Zimmermann
,
Huili Xing
,
Debdeep Jena
Conference:
Device Research Conference - DRC
, pp. 121-122, 2011
An Empirical Study on the Relation between Dependency Neighborhoods and Failures
Thomas Zimmermann
,
Nachiappan Nagappan
,
Kim Herzig
,
Rahul Premraj
,
Laurie Williams
Conference:
International Conference on Software Testing, Verification, and Validation - ICST
, pp. 347-356, 2011
Crash graphs: An aggregated view of multiple crashes to improve crash triage
Sunghun Kim
,
Thomas Zimmermann
,
Nachiappan Nagappan
Conference:
Dependable Systems and Networks - DSN
, pp. 486-493, 2011
Order by:
Citations
(1949 times by 1183 publications)
210GHz InAlN/GaN HEMTs With Dielectric-Free Passivation
(
Citations: 2
)
Ronghua Wang
,
Guowang Li
,
Oleg Laboutin
,
Yu Cao
,
Wayne Johnson
,
Gregory Snider
,
Patrick Fay
,
Debdeep Jena
,
Huili Xing
Journal:
IEEE Electron Device Letters - IEEE ELECTRON DEV LETT
, vol. 32, no. 7, pp. 892-894, 2011
Improving Source Code Lexicon via Traceability and Information Retrieval
(
Citations: 2
)
Andrea De Lucia
,
Massimiliano Di Penta
,
Rocco Oliveto
Journal:
IEEE Transactions on Software Engineering - TSE
, vol. 37, no. 2, pp. 205-227, 2011
Evolutionary repair of faulty software
(
Citations: 2
)
Andrea Arcuri
Journal:
Applied Soft Computing - ASC
, vol. 11, no. 4, pp. 3494-3514, 2011
Enhancement-Mode N-Polar GaN MISFETs With Self-Aligned Source/Drain Regrowth
(
Citations: 1
)
Uttam Singisetti
,
Man Hoi Wong
,
Sansaptak Dasgupta
,
Nidhi
,
Brian Swenson
,
Brian J. Thibeault
,
James S. Speck
,
Umesh K. Mishra
Journal:
IEEE Electron Device Letters - IEEE ELECTRON DEV LETT
, vol. 32, no. 2, pp. 137-139, 2011
Empirical software engineering at Microsoft Research
(
Citations: 1
)
Christian Bird
,
Brendan Murphy
,
Nachiappan Nagappan
,
Thomas Zimmermann
Conference:
Conference on Computer Supported Cooperative Work - CSCW
, pp. 143-150, 2011
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