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(48)
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4
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Authors
R. D. Shawn Blanton
R. D. Shawn Blanton,Carnegie Mellon University,Hardware & Architecture,Software Engineering,Medicine
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R. D. Shawn Blanton
Carnegie Mellon University
Publications:
28
|
Citations:
115
Fields:
Hardware & Architecture
,
Software Engineering
,
Medicine
View FAQ about top research areas and Fields of study
Collaborated with
48 co-authors
from 1998 to 2012
|
Cited by
192 authors
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Publications
(28)
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Physically-Aware $N$ Detect Test
Yen-Tzu Lin
,
Osei Poku
,
R. D. Shawn Blanton
,
Phil Nigh
,
Peter Lloyd
,
Vikram Iyengar
Journal:
IEEE Transactions on Computer-aided Design of Integrated Circuits and Systems
, vol. 31, no. 2, pp. 308-321, 2012
Test-data volume optimization for diagnosis
Hongfei Wang
,
Osei Poku
,
Xiaochun Yu
,
Sizhe Liu
,
Ibrahima Komara
,
R. D. Blanton
Published in 2012.
METER: Measuring Test Effectiveness Regionally
Yen-Tzu Lin
,
R. D. Shawn Blanton
Journal:
IEEE Transactions on Computer-aided Design of Integrated Circuits and Systems
, vol. 30, no. 7, pp. 1058-1071, 2011
SLIDER: A fast and accurate defect simulation framework
Wing Chiu Tam
,
R. D. Blanton
Conference:
IEEE VLSI Test Symposium - VTS
, pp. 172-177, 2011
Enhancing CMOS Using Nanoelectronic Devices: A Perspective on Hybrid Integrated Systems
(
Citations: 1
)
David S. Ricketts
,
James A. Bain
,
Yi Luo
,
R. D. Blanton
,
Kenneth Mai
,
Gary K. Fedder
Journal:
Proceedings of The IEEE - PIEEE
, vol. 98, no. 12, pp. 2061-2075, 2010
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Citations
(115 times by 103 publications)
Structural InField Diagnosis for Random Logic Circuits
Alejandro Cook
,
Melanie Elm
,
Hans-Joachim Wunderlich
,
Ulrich Abelein
Conference:
European Test Symposium - ETS
, pp. 111-116, 2011
METER: Measuring Test Effectiveness Regionally
Yen-Tzu Lin
,
R. D. Shawn Blanton
Journal:
IEEE Transactions on Computer-aided Design of Integrated Circuits and Systems
, vol. 30, no. 7, pp. 1058-1071, 2011
SLIDER: A fast and accurate defect simulation framework
Wing Chiu Tam
,
R. D. Blanton
Conference:
IEEE VLSI Test Symposium - VTS
, pp. 172-177, 2011
On diagnosis of multiple faults using compacted responses
Jing Ye
,
Yu Hu
,
Xiaowei Li
Published in 2011.
A Comprehensive Framework for Logic Diagnosis of Arbitrary Defects
(
Citations: 4
)
Alberto Bosio
,
Patrick Girard
,
Serge Pravossoudovitch
,
Arnaud Virazel
Journal:
IEEE Transactions on Computers - TC
, vol. 59, no. 3, pp. 289-300, 2010
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