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Co-authors
(64)
Kuan-Fu Chen
9
Wen-Pin Lu
8
Mike Chen
8
Kuang-Chao Chen
8
Yijia Chen (陈翌佳)
7
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Academic
Authors
T. T. Han
T. T. Han,National Chiao Tung University, Taiwan,Artificial Intelligence,Electrical & Electronic Engineering,Mechanical Engineering
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T. T. Han
National Chiao Tung University, Taiwan
Publications:
12
|
Citations:
20
Fields:
Artificial Intelligence
,
Electrical & Electronic Engineering
,
Mechanical Engineering
View FAQ about top research areas and Fields of study
Collaborated with
64 co-authors
from 2004 to 2011
|
Cited by
70 authors
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Annual
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Publications
(12)
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Characterization of junction dosage effect on NAND arrays with charge pumping method
Chienying Lee
,
C. H. Lee
,
C. H. Cheng
,
L. H. Chong
,
K. F. Chen
,
Y. J. Chen
,
J. S. Huang
,
S. H. Ku
,
N. K. Zous
,
I. J. Huang
,
T. T. Han
,
M. S. Chen
http://academic.research.microsoft.com/io.ashx?type=5&id=51054255&selfId1=18889130&selfId2=0&maxNumber=12&query=
Conference:
International Symposium on VLSI Technology, Systems and Applications - VLSI-TSA
, pp. 1-2, 2011
Junction optimization for Reliability issues in floating gate NAND flash cells
C. H. Lee
,
I. C. Yang
,
Chienying Lee
,
C. H. Cheng
,
L. H. Chong
,
K. F. Chen
,
J. S. Huang
,
S. H. Ku
,
N. K. Zous
,
I. J. Huang
,
T. T. Han
,
M. S. Chen
http://academic.research.microsoft.com/io.ashx?type=5&id=51054078&selfId1=18889130&selfId2=0&maxNumber=12&query=
Published in 2011.
Study of electron and hole injection statistics of BE-SONOS NAND Flash
(
Citations: 3
)
Hang-Ting Lue
,
Tzu-Hsuan Hsu
,
Sheng-Chih Lai
,
Y. J. Chen
,
K. F. Chen
,
Chester Lo
,
I. J. Huang
,
T. T. Han
,
M. S. Chen
,
W. P. Lu
,
K. C. Chen
,
C. S. Chang
http://academic.research.microsoft.com/io.ashx?type=5&id=50893740&selfId1=18889130&selfId2=0&maxNumber=12&query=
Conference:
IEEE International Memory Workshop, IMW - IMW
, 2010
Chip-level reliability study of barrier engineered (BE) floating gate (FG) Flash memory devices
Hang-Ting Lue
,
JiFong Pan
,
C. S. Chang
,
Szu-Yu Wang
,
Y. F. Chang
,
Y. C. Lee
,
M. H. Liaw
,
Y. J. Chen
,
K. F. Chen
,
C. Lo
,
I. J. Huang
,
T. T. Han
http://academic.research.microsoft.com/io.ashx?type=5&id=50894158&selfId1=18889130&selfId2=0&maxNumber=12&query=
Published in 2010.
Evaluations for a highly scalable, reliable vertical channel SONOS memory
Y. F. Huang
,
K. F. Chen
,
K. Y. Chen
,
K. L. Wei
,
Y. J. Chen
,
M. C. Hsu
,
G. W. Wu
,
I. C. Yang
,
T. T. Han
,
L. H. Chong
,
S. H. Gu
,
N. K. Zous
http://academic.research.microsoft.com/io.ashx?type=5&id=50895015&selfId1=18889130&selfId2=0&maxNumber=12&query=
Conference:
International Symposium on VLSI Technology, Systems and Applications - VLSI-TSA
, pp. 59-60, 2010
Sort by:
Citations
(20 times by 20 publications)
Three-Dimensional Simulation of Charge-Trap Memory Programming—Part II: Variability
(
Citations: 1
)
Alessandro Maconi
,
Salvatore Maria Amoroso
,
Christian Monzio Compagnoni
,
Aurelio Mauri
,
Alessandro S. Spinelli
,
Andrea L. Lacaita
Journal:
IEEE Transactions on Electron Devices - IEEE TRANS ELECTRON DEVICES
, vol. 58, no. 7, pp. 1872-1878, 2011
A Comprehensive Understanding of the Erase of TANOS Memories Through Charge Separation Experiments and Simulations
Andrea Padovani
,
Antonio Arreghini
,
Luca Vandelli
,
Luca Larcher
,
Geert Van den bosch
,
Paolo Pavan
,
Jan Van Houdt
Journal:
IEEE Transactions on Electron Devices - IEEE TRANS ELECTRON DEVICES
, vol. 58, no. 9, pp. 3147-3155, 2011
State-of-the-art flash memory devices and post-flash emerging memories
ChihYuan Lu
,
HangTing Lue
,
YiChou Chen
Journal:
Science in China Series F: Information Sciences
, vol. 54, no. 5, pp. 1039-1060, 2011
3D Monte Carlo simulation of the programming dynamics and their statistical variability in nanoscale charge-trap memories
(
Citations: 2
)
S. M. Amoroso
,
A. Maconi
,
A. Mauri
,
C. M. Compagnoni
,
E. Greco
,
E. Camozzi
,
S. Vigano
,
P. Tessariol
,
A. Ghetti
,
A. S. Spinelli
,
A. L. Lacaita
Conference:
International Electron Devices Meeting - IEDM
, pp. 22.6.1-22.6.4, 2010
Experimental and Simulation Analysis of Program/Retention Transients in Silicon Nitride-Based NVM Cells
(
Citations: 11
)
Elisa Vianello
,
Francesco Driussi
,
Antonio Arreghini
,
Pierpaolo Palestri
,
David Esseni
,
Luca Selmi
,
Nader Akil
,
Michiel J. van Duuren
,
Dusan S. Golubovic
Journal:
IEEE Transactions on Electron Devices - IEEE TRANS ELECTRON DEVICES
, vol. 56, no. 9, pp. 1980-1990, 2009
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