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Co-authors
(125)
Ming-Jinn Tsai
28
Frederick Ta. Chen
24
Yu-Sheng Chen
17
Pang-Shiu Chen
16
Ming J. Tsai
14
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(6)
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Academic
Authors
Heng-Yuan Lee
Heng-Yuan Lee,Industrial Technology Research Institute of Taiwan,Electrical & Electronic Engineering,Mechanical Engineering,Hardware & Architecture
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Heng-Yuan Lee
Industrial Technology Research Institute of Taiwan
Publications:
43
|
Citations:
126
Fields:
Electrical & Electronic Engineering
,
Mechanical Engineering
,
Hardware & Architecture
View FAQ about top research areas and Fields of study
Collaborated with
125 co-authors
from 2006 to 2012
|
Cited by
327 authors
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Publications
(43)
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Suppressed soft-errors and highly reduced current for HfOX based unipolar RRAM by inserting AlOX layer
Yu-Sheng Chen
,
Heng-Yuan Lee
,
Pang-Shiu Chen
,
Kan-Hsueh Tsai
,
Tai-Yuan Wu
,
Wei-Su Chen
,
Chen-Han Tsai
,
Pei-Yi Gu
,
Yi-Ying Liao
,
Frederick Chen
,
Chen-Hsin Lien
,
Ming-Jinn Tsai
Published in 2012.
Metal–Oxide RRAM
H.-S. Philip Wong
,
Heng-Yuan Lee
,
Shimeng Yu
,
Yu-Sheng Chen
,
Yi Wu
,
Pang-Shiu Chen
,
Byoungil Lee
,
Frederick T. Chen
,
Ming-Jinn Tsai
Journal:
Proceedings of The IEEE - PIEEE
, vol. 100, no. 6, pp. 1951-1970, 2012
AlOx-Based Resistive Switching Device with Gradual Resistance Modulation for Neuromorphic Device Application
Yi Wu
,
Shimeng Yu
,
H.-S. Philip Wong
,
Yu-Sheng Chen
,
Heng-Yuan Lee
,
Sum-Min Wang
,
Pei-Yi Gu
,
Frederick Chen
,
Ming-Jinn Tsai
Conference:
IEEE International Memory Workshop, IMW - IMW
, 2012
IC process compatible anodic electrode structures for unipolar HfOx-based RRAM
(
Citations: 1
)
W. S. Chen
,
Y. S. Chen
,
Y. Y. Hsu
,
S. Y. Yang
,
W. H. Liu
,
H. Y. Lee
,
P. Y. Gu
,
C. H. Tsai
,
S. M. Wang
,
P. S. Chen
,
Y. H. Wang
,
F. T. Chen
http://academic.research.microsoft.com/io.ashx?type=5&id=51054235&selfId1=19068193&selfId2=0&maxNumber=12&query=
Conference:
International Symposium on VLSI Technology, Systems and Applications - VLSI-TSA
, pp. 1-2, 2011
A 4Mb embedded SLC resistive-RAM macro with 7.2ns read-write random-access time and 160ns MLC-access capability
(
Citations: 1
)
Shyh-Shyuan Sheu
,
Meng-Fan Chang
,
Ku-Feng Lin
,
Che-Wei Wu
,
Yu-Sheng Chen
,
Pi-Feng Chiu
,
Chia-Chen Kuo
,
Yih-Shan Yang
,
Pei-Chia Chiang
,
Wen-Pin Lin
,
Che-He Lin
,
Heng-Yuan Lee
http://academic.research.microsoft.com/io.ashx?type=5&id=51036622&selfId1=19068193&selfId2=0&maxNumber=12&query=
Conference:
Solid-State Circuits IEEE International Conference - ISSCC
, pp. 200-202, 2011
Sort by:
Citations
(126 times by 86 publications)
A High-Yield $\hbox{HfO}_{x}$Based Unipolar Resistive RAM Employing Ni Electrode Compatible With Si-Diode Selector for Crossbar Integration
(
Citations: 2
)
X. A. Tran
,
H. Y. Yu
,
Y. C. Yeo
,
L. Wu
,
W. J. Liu
,
Z. R. Wang
,
Z. Fang
,
K. L. Pey
,
X. W. Sun
,
A. Y. Du
,
B. Y. Nguyen
,
M. F. Li
Journal:
IEEE Electron Device Letters - IEEE ELECTRON DEV LETT
, vol. 32, no. 3, pp. 396-398, 2011
Ultralow Switching Energy Ni/$\hbox{GeO}_{x}$ /HfON/TaN RRAM
(
Citations: 1
)
C. H. Cheng
,
Albert Chin
,
F. S. Yeh
Journal:
IEEE Electron Device Letters - IEEE ELECTRON DEV LETT
, vol. 32, no. 3, pp. 366-368, 2011
Resistive switching of silicon-rich-oxide featuring high compatibility with CMOS technology for 3D stackable and embedded applications
(
Citations: 1
)
Ru Huang
,
Lijie Zhang
,
Dejin Gao
,
Yue Pan
,
Shiqiang Qin
,
Poren Tang
,
Yimao Cai
,
Yangyuan Wang
Journal:
Applied Physics A-materials Science & Processing - APPL PHYS A-MAT SCI PROCESS
, vol. 102, no. 4, pp. 927-931, 2011
Universal Reset Characteristics of Unipolar and Bipolar Metal-Oxide RRAM
(
Citations: 1
)
Daniele Ielmini
,
Federico Nardi
,
Carlo Cagli
Journal:
IEEE Transactions on Electron Devices - IEEE TRANS ELECTRON DEVICES
, vol. 58, no. 10, pp. 3246-3253, 2011
The Effect of Tunnel Barrier at Resistive Switching Device for Low Power Memory Applications
Hyejung Choi
,
Jaeyun Yi
,
Sangmin Hwang
,
Sangkeum Lee
,
Seokpyo Song
,
Seunghwan Lee
,
Jaeyeon Lee
,
Donghee Son
,
Suk-Ju Kim
,
Ja-Yong Kim
,
Sunghoon Lee
,
Jiwon Moon
http://academic.research.microsoft.com/io.ashx?type=5&id=51056385&selfId1=19068193&selfId2=0&maxNumber=12&query=
Conference:
IEEE International Memory Workshop, IMW - IMW
, 2011
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