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P. Boucaud

P. Boucaud,Paris-Sud 11 University,Polymer Chemistry,Material Synthesis & Processes,Metallurgy

P. Boucaud

Paris-Sud 11 University

Publications: 11 | Citations: 11

Fields: Polymer Chemistry, Material Synthesis & Processes, Metallurgy

Collaborated with 57 co-authors from 1993 to 2005 | Cited by 50 authors

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Publications (11)

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Ge islands and photonic crystals for Si-based photonics (Citations: 2)

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Journal: Optical Materials - OPT MATER , vol. 27, no. 5, pp. 792-798, 2005

Role of point defects on the optical properties of self-assembled Ge/Si hut clusters

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Journal: Journal of Crystal Growth - J CRYST GROWTH , vol. 275, no. 1, pp. e1287-e1294, 2005

Aspects of Ge/Si self-assembled quantum dots

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Journal: Materials Science and Engineering B-advanced Functional Solid-state Materials , vol. 89, no. 1, pp. 36-44, 2002

On the formation of self-assembled Ge/Si(0 0 1) quantum dots (Citations: 1)

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Journal: Journal of Crystal Growth - J CRYST GROWTH , vol. 201, no. 3, pp. 1212-1217, 1999

Structural particularities of carbon-incorporated SiGe heterostructures (Citations: 1)

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Journal: Materials Science and Engineering B-advanced Functional Solid-state Materials , vol. 36, no. 1, pp. 286-290, 1996

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Citations (11 times by 11 publications)

Outcoupling of Light Generated in a Monolithic Silicon Photonic Crystal Nanocavity through a Lateral Waveguide

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Journal: Japanese Journal of Applied Physics , vol. 48, no. No. 6, 2009

Delivery of photons generated in silicon photonic crystal nano-cavity through lateral waveguide

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Conference: IEEE International Conference on Group IV Photonics - GFP , 2008

Laser endotaxy in silicon carbide and PIN diode fabrication

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Journal: Journal of Laser Applications - J LASER APPL , vol. 20, no. 2, 2008

The study of a novel crystal SiGeC far infrared sensor with thermal isolated by MEMS technology

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Journal: Microsystem Technologies-micro-and Nanosystems-information Storage and Processing Systems - MICROSYST TECHNOL , vol. 12, no. 10, pp. 999-1004, 2006

Crystal SiGeC far infrared sensor with temperature isolation improvement structure

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Journal: Electronics Letters - ELECTRON LETT , vol. 39, no. 8, 2003

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