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Co-authors
(18)
Jang Roh Rhee
3
Chang-gun Lee (이창건)
2
Young Keun Kim
2
Chunghun Ha
2
Byong Sun Chun
2
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Thin Solid Films
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Authors
Jung Yoon Hwang
Jung Yoon Hwang,Michigan Technological University,Mechanical Engineering,Electrical & Electronic Engineering,Computer Science
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Jung Yoon Hwang
Michigan Technological University
Publications:
9
|
Citations:
21
Fields:
Mechanical Engineering
,
Electrical & Electronic Engineering
,
Computer Science
View FAQ about top research areas and Fields of study
Collaborated with
18 co-authors
from 2002 to 2011
|
Cited by
24 authors
Cumulative
Annual
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Publications
(9)
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An Investigation of Particle Size Variation in Stirred Mills in Terms of Breakage Kinetics
(
Citations: 1
)
S. Samanli
,
D. Cuhadaroglu
,
J. Y. Hwang
Journal:
Energy Sources Part A-recovery Utilization and Environmental Effects
, vol. 33, no. 6, pp. 549-561, 2011
Domain wall generation and propagation in an amorphous ferromagnetic NiFeSiB film confirmed by the magneto-optical indicator film method
B. S. Chun
,
Y. K. Kim
,
J. Y. Hwang
,
J. R. Rhee
,
Y. M. Lee
,
V. S. Gornakov
,
C. G. Lee
Journal:
Thin Solid Films
, vol. 519, no. 10, pp. 3301-3304, 2011
Domain wall generation and propagation in an amorphous ferromagnetic NiFeSiB film confirmed by the magneto-optical indicator film method
B. S. Chun
,
Y. K. Kim
,
J. Y. Hwang
,
J. R. Rhee
,
Y. M. Lee
,
V. S. Gornakov
,
C. G. Lee
Journal:
Thin Solid Films
, vol. 519, pp. 3301-3304, 2011
Modeling of Integrated Circuit Yield Using a Spatial Nonhomogeneous Poisson Process
Jung Yoon Hwang
,
Chunghun Ha
Journal:
IEEE Transactions on Semiconductor Manufacturing - IEEE TRANS SEMICONDUCT MANUF
, vol. 24, no. 3, pp. 377-384, 2011
A Study on the Experimental Dynamic Identification of Cylindrical Oil Dampers in the Wide Frequency Range
S. J. Moon
,
H. S. Kim
,
T. Y. Chung
,
D. H. Lee
,
J. Y. Hwang
Journal:
Transactions of The Korean Society for Noise and Vibration Engineering
, vol. 20, no. 6, pp. 528-536, 2010
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Citations
(21 times by 18 publications)
Multi-step ART1 algorithm for recognition of defect patterns on semiconductor wafers
Gyunghyun Choi
,
Sung-Hee Kim
,
Chunghun Ha
,
Suk Joo Bae
Journal:
International Journal of Production Research - INT J PROD RES
, vol. 50, no. 12, pp. 3274-3287, 2012
Multi-step ART1 algorithm for recognition of defect patterns on semiconductor wafers
Gyunghyun Choi
,
Sung-Hee Kim
,
Chunghun Ha
,
Suk Joo Bae
Journal:
International Journal of Production Research - INT J PROD RES
, vol. ahead-of-p, no. ahead-of-p, pp. 1-14, 2011
Yield Prediction for Integrated Circuits Manufacturing Through Hierarchical Bayesian Modeling of Spatial Defects
Tao Yuan
,
Saleem Z. Ramadan
,
Suk Joo Bae
Journal:
IEEE Transactions on Reliability - TR
, vol. 60, no. 4, pp. 729-741, 2011
Modeling of Integrated Circuit Yield Using a Spatial Nonhomogeneous Poisson Process
Jung Yoon Hwang
,
Chunghun Ha
Journal:
IEEE Transactions on Semiconductor Manufacturing - IEEE TRANS SEMICONDUCT MANUF
, vol. 24, no. 3, pp. 377-384, 2011
Detection of Spatial Defect Patterns Generated in Semiconductor Fabrication Processes
Tao Yuan
,
Suk Joo Bae
Journal:
IEEE Transactions on Semiconductor Manufacturing - IEEE TRANS SEMICONDUCT MANUF
, vol. 24, no. 3, pp. 392-403, 2011
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