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Co-authors
(11)
Jong-ho Lee (이종호)
4
Hyung-Cheol Shin
3
ByoungHun Lee (이병헌)
2
Byung-Gook Park
2
Young June Park
1
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(1)
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2
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(2)
IEEE ELECTRON DEV LETT
1
IEEE TRANS ELECTRON DEVICES
1
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(11)
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Authors
Ju-Wan Lee
Ju-Wan Lee,Electrical & Electronic Engineering
Edit
Ju-Wan Lee
Publications:
4
|
Citations:
2
Fields:
Electrical & Electronic Engineering
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Collaborated with
11 co-authors
from 2008 to 2010
|
Cited by
10 authors
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Annual
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Publications
(4)
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RefWorks
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Investigation of Random Telegraph Noise in Gate-Induced Drain Leakage and Gate Edge Direct Tunneling Currents of High MOSFETs
(
Citations: 2
)
Ju-Wan Lee
,
Byoung Hun Lee
,
Hyungcheol Shin
,
Jong-Ho Lee
Journal:
IEEE Transactions on Electron Devices - IEEE TRANS ELECTRON DEVICES
, vol. 57, no. 4, pp. 913-918, 2010
Comparison of Low-Frequency Noise in Channel and Gate-Induced Drain Leakage Currents of High nFETs
Ju-Wan Lee
,
Byoung Hun Lee
,
Hyungcheol Shin
,
Byung-Gook Park
,
Young June Park
,
Jong-Ho Lee
Journal:
IEEE Electron Device Letters - IEEE ELECTRON DEV LETT
, vol. 31, no. 10, pp. 1086-1088, 2010
3-D stacked active layers and vertical gate NAND flash string with single-crystal Si channel by adopting Si/SiGe selective etch process
Ju-Wan Lee
,
Min-Kyu Jeong
,
Hyuck-In Kwon
,
Byung-Gook Park
,
Hyungcheol Shin
,
Jong-Ho Lee
Conference:
IEEE Silicon Nanoelectronics Workshop - SNW
, 2010
Extraction of RF parameters in planar channel MOSFETs through RF device modeling
Ju-Wan Lee
,
Sung-Man Cho
,
Gwang-Doo Jo
,
Young-Kwang Kim
,
Il-Hun Son
,
Jong-Ho Lee
Conference:
IEEE Silicon Nanoelectronics Workshop - SNW
, 2008
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Citations
(2 times by 2 publications)
Characterization of an Oxide Trap Leading to Random Telegraph Noise in Gate-Induced Drain Leakage Current of DRAM Cell Transistors
(
Citations: 2
)
Byoungchan Oh
,
Heung-Jae Cho
,
Heesang Kim
,
Younghwan Son
,
Taewook Kang
,
Sunyoung Park
,
Seunghyun Jang
,
Jong-Ho Lee
,
Hyungcheol Shin
Journal:
IEEE Transactions on Electron Devices - IEEE TRANS ELECTRON DEVICES
, vol. 58, no. 6, pp. 1741-1747, 2011
Investigation of Gate Etch Damage at Metal/High$k$ Gate Dielectric Stack Through Random Telegraph Noise in Gate Edge Direct Tunneling Current
Heung-Jae Cho
,
Younghwan Son
,
Byoungchan Oh
,
Seunghyun Jang
,
Jong-Ho Lee
,
Byung-Gook Park
,
Hyungcheol Shin
Journal:
IEEE Electron Device Letters - IEEE ELECTRON DEV LETT
, vol. 32, no. 4, pp. 569-571, 2011
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