Sign in
Author
|
Conference
|
Journal
|
Organization
|
Year
|
DOI
Look for results that meet for the following criteria:
since
equal to
before
between
and
Search in all fields of study
Limit my searches in the following fields of study
Agriculture Science
Arts & Humanities
Biology
Chemistry
Computer Science
Economics & Business
Engineering
Environmental Sciences
Geosciences
Material Science
Mathematics
Medicine
Physics
Social Science
Multidisciplinary
Co-authors
(16)
Dimitris Gizopoulos
33
Antonis M. Paschalis
30
Yervant Zorian
17
Mihalis Psarakis
12
Andreas Merentitis
9
Conferences
(7)
DATE
11
IOLTS
5
ITC
3
VTS
3
ETS
2
Journals
(6)
IEEE D&ToC
2
Journal of Electronic Testing
2
TC
1
TDSC
1
TR
1
Keywords
(99)
Embed
Subscribe
Academic
Authors
Nektarios Kranitis
Nektarios Kranitis,National and Kapodistrian University of Athens, Greece,Hardware & Architecture,Software Engineering,Algorithms & Theory
Edit
Nektarios Kranitis
National and Kapodistrian University of Athens, Greece
Publications:
35
|
Citations:
321
Fields:
Hardware & Architecture
,
Software Engineering
,
Algorithms & Theory
View FAQ about top research areas and Fields of study
Collaborated with
16 co-authors
from 1999 to 2012
|
Cited by
320 authors
Cumulative
Annual
Sort by:
Publications
(35)
BibTeX
|
RIS
|
RefWorks
Download
A Software-Based Self-Test methodology for on-line testing of data TLBs
G. Theodorou
,
S. Chatzopoulos
,
N. Kranitis
,
A. Paschalis
,
D. Gizopoulos
Conference:
European Test Symposium - ETS
, 2012
Low Energy Online Self-Test of Embedded Processors in Dependable WSN Nodes
Andreas Merentitis
,
Nektarios Kranitis
,
Antonis Paschalis
,
Dimitris Gizopoulos
Journal:
IEEE Transactions on Dependable and Secure Computing - TDSC
, vol. 9, no. 1, pp. 86-100, 2012
A Software-Based Self-Test methodology for on-line testing of processor caches
G. Theodorou
,
N. Kranitis
,
A. Paschalis
,
D. Gizopoulos
Conference:
International Test Conference - ITC
, pp. 1-10, 2011
A software-based self-test methodology for in-system testing of processor cache tag arrays
(
Citations: 1
)
G. Theodorou
,
N. Kranitis
,
A. Paschalis
,
D. Gizopoulos
Conference:
International On-Line Testing Symposium - IOLTS
, 2010
SBST for on-line detection of hard faults in multiprocessor applications under energy constraints
A. Merentitis
,
D. Margaris
,
N. Kranitis
,
A. Paschalis
,
D. Gizopoulos
Conference:
International On-Line Testing Symposium - IOLTS
, 2010
Sort by:
Citations
(321 times by 215 publications)
Low Energy Online Self-Test of Embedded Processors in Dependable WSN Nodes
Andreas Merentitis
,
Nektarios Kranitis
,
Antonis Paschalis
,
Dimitris Gizopoulos
Journal:
IEEE Transactions on Dependable and Secure Computing - TDSC
, vol. 9, no. 1, pp. 86-100, 2012
Automatic saboteur placement for emulation-based multi-bit fault injection
(
Citations: 1
)
Johannes Grinschgl
,
Armin Krieg
,
Christian Steger
,
Reinhold Weiss
,
Holger Bock
,
Josef Haid
Conference:
International Workshop on Reconfigurable Communication-Centric Systems-on-Chip - ReCoSoC
, 2011
Quantification and mitigation strategies of neutron induced soft-errors in CMOS devices and components
Eishi Ibe
,
Ken-ichi Shimbo
,
Hitoshi Taniguchi
,
Tadanobu Toba
,
Koji Nishii
,
Yoshio Taniguchi
Published in 2011.
A new hierarchical built-in self-test with on-chip diagnosis for VLIW processors
Markus Ulbricht
,
Mario Scholzel
,
Tobias Koal
,
Heinrich Theodor Vierhaus
Conference:
Workshop on Design and Diagnostics of Electronic Circuits and Systems - DDECS
, 2011
A low power test pattern generation for built-in self-test based circuits
Bo Ye
,
Tianwang Li
,
Qian Zhao
,
Duo Zhou
,
Xiaohua Wang
,
Min Luo
Journal:
International Journal of Electronics - INT J ELECTRON
, vol. 98, no. 3, pp. 301-309, 2011
Comments