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Co-authors
(10)
Bernd Straube
4
Wolfgang Vermeiren
4
Bernd Becker
3
Ilia Polian
3
Sybille Hellebrand
3
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(3)
ATS
2
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1
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1
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Science in China Series F: Information Sciences
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Authors
Fabian Hopsch
Fabian Hopsch,Dresden University of Technology,Hardware & Architecture
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Fabian Hopsch
Dresden University of Technology
Publications:
5
|
Citations:
4
Fields:
Hardware & Architecture
View FAQ about top research areas and Fields of study
Collaborated with
10 co-authors
from 2010 to 2011
|
Cited by
9 authors
Cumulative
Annual
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Publications
(5)
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Characterization of digital cells for statistical test
(
Citations: 1
)
Fabian Hopsch
,
Michael Lindig
,
Bernd Straube
,
Wolfgang Vermeiren
Conference:
Workshop on Design and Diagnostics of Electronic Circuits and Systems - DDECS
, 2011
Variation-aware fault modeling
Fabian Hopsch
,
Bernd Becker
,
Sybille Hellebrand
,
Ilia Polian
,
Bernd Straube
,
Wolfgang Vermeiren
,
Hans-Joachim Wunderlich
Journal:
Science in China Series F: Information Sciences
, vol. 54, no. 9, pp. 1813-1826, 2011
Variation-Aware Fault Modeling
(
Citations: 3
)
Fabian Hopsch
,
Bernd Becker
,
Sybille Hellebrand
,
Ilia Polian
,
Bernd Straube
,
Wolfgang Vermeiren
,
Hans-Joachim Wunderlich
Conference:
Test, Asian Symposium - ATS
, pp. 87-93, 2010
Special Panel Session
F. Hopsch
,
H.-J. Wunderlich
,
I. Polian
,
B. Becker
,
S. Hellebrand
Conference:
Test, Asian Symposium - ATS
, pp. xviii-xviii, 2010
Developing digital test sequences for through-silicon vias within 3D structures
Matthias Gulbins
,
Fabian Hopsch
,
Peter Schneider
,
Bernd Straube
,
Wolfgang Vermeiren
Conference:
IEEE International Conference on 3D System Integration - 3DIC
, 2010
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Citations
(4 times by 3 publications)
SAT-based analysis of sensitisable paths
(
Citations: 1
)
Matthias Sauer
,
Alexander Czutro
,
Tobias Schubert
,
Stefan Hillebrecht
,
Ilia Polian
,
Bernd Becker
Conference:
Workshop on Design and Diagnostics of Electronic Circuits and Systems - DDECS
, 2011
Characterization of digital cells for statistical test
(
Citations: 1
)
Fabian Hopsch
,
Michael Lindig
,
Bernd Straube
,
Wolfgang Vermeiren
Conference:
Workshop on Design and Diagnostics of Electronic Circuits and Systems - DDECS
, 2011
Estimation of component criticality in early design steps
Matthias Sauer
,
Alexander Czutro
,
Ilia Polian
,
Bernd Becker
Conference:
International On-Line Testing Symposium - IOLTS
, 2011
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