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Co-authors
(12)
Fabrizio Lombardi
20
Xiao-tao Chen
4
Fred J. Meyer
3
Tong Liu
2
Laxmi Narayan Bhuyan
1
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(11)
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Authors
Wei Kang Huang
Wei Kang Huang,Fudan University,Hardware & Architecture,Electrical & Electronic Engineering,Distributed & Parallel Computing
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Wei Kang Huang
Fudan University
Publications:
20
|
Citations:
143
Fields:
Hardware & Architecture
,
Electrical & Electronic Engineering
,
Distributed & Parallel Computing
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Collaborated with
12 co-authors
from 1988 to 2001
|
Cited by
166 authors
Cumulative
Annual
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Publications
(20)
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Testing IP cores with pseudo exhaustive test sets
R. Tang
,
P. F. Si
,
W. K. Huang
,
F. Lombardi
Conference:
International Conference on - ASIC
, 2001
Testing memory modules in SRAM-based configurable FPGAs
(
Citations: 26
)
W. K. Huang
,
F. J. Meyer
,
F. Lombardi
Conference:
Memory Technology, Design and Testing - MTDT
, pp. 79-86, 1997
A general technique for testing FPGAs
(
Citations: 11
)
W. K. Huang
,
F. J. Meyer
,
X. T. Chen
,
F. Lombardi
Conference:
IEEE VLSI Test Symposium - VTS
, 1996
Array-based testing of FPGAs: architecture and complexity
(
Citations: 6
)
W. K. Huang
,
F. J. Meyer
,
F. Lombardi
Published in 1996.
An approach to testing of Programmable/Con gurable FPGAs
(
Citations: 7
)
W. K. Huang
,
F. Lombardi
Conference:
IEEE VLSI Test Symposium - VTS
, 1996
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Citations
(143 times by 127 publications)
Reliability Analysis and Improvement in Nano Scale Design
Mahtab Niknahad
,
Michael Huebner
,
Juergen Becker
Conference:
Annual Symposium on VLSI
, pp. 299-303, 2010
Fault propagation and diagnosis of LUTs in an FPGA without fault free assumptions
T. Nandha Kumar
Conference:
Electronic Devices, Systems and Applications Internation Conference - ICEDSA
, 2010
Propagation and diagnosis faulty LUTs in an FPGA
T. Nandha Kumar
Published in 2010.
Built-in Self-Test Design for Fault Detection and Fault Diagnosis in SRAM-Based FPGA
(
Citations: 2
)
Chun-Lung Hsu
,
Ting-Hsuan Chen
Journal:
IEEE Transactions on Instrumentation and Measurement - IEEE TRANS INSTRUM MEAS
, vol. 58, no. 7, pp. 2300-2315, 2009
An Optimum ORA BIST for Multiple Fault FPGA Look-Up Table Testing
(
Citations: 2
)
Armin Alaghi
,
Mahnaz Sadoughi Yarandi
,
Zainalabedin Navabi
Conference:
Asian Test Symposium - ATS
, 2009
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