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Co-authors
(131)
Ilan Bloom
17
Eli Lusky
11
Assaf Shappir
8
Yosi Y. Shacham-Diamand
7
Paolo Pavan
6
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Academic
Authors
Boaz Eitan
Boaz Eitan,University of Tübingen,Electrical & Electronic Engineering,Nanotechnology
Edit
Boaz Eitan
University of Tübingen
Publications:
25
|
Citations:
424
Fields:
Electrical & Electronic Engineering
,
Nanotechnology
View FAQ about top research areas and Fields of study
Collaborated with
131 co-authors
from 2000 to 2009
|
Cited by
968 authors
Cumulative
Annual
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Publications
(25)
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RefWorks
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Interface states formation in a localized charge trapping nonvolatile memory device
Asia Shapira
,
Yael Shur
,
Yosi Shacham-Diamand
,
Assaf Shappir
,
Boaz Eitan
Journal:
Journal of Vacuum Science & Technology B - J VAC SCI TECHNOL B
, vol. 27, no. 1, 2009
Relaxation of localized charge in trapping-based nonvolatile memory devices
(
Citations: 1
)
Meir Janai
,
Assaf Shappir
,
Ilan Bloom
,
Boaz Eitan
Conference:
Reliability Physics, Annual International Symposium - IRPS
, 2008
A 4b/Cell 8Gb NROM Data-Storage Memory with Enhanced Write Performance
Ran Sahar
,
Avi Lavan
,
Eran Geyari
,
Amit Berman
,
Itzic Cohen
,
Ori Tirosh
,
Kobi Danon
,
Yair Sofer
,
Yoram Betser
,
Amichai Givant
,
Alexander Kushnarenko
,
Yaal Horesh
Boaz Eitan
http://academic.research.microsoft.com/io.ashx?type=5&id=50647745&selfId1=401777&selfId2=0&maxNumber=12&query=
Conference:
Solid-State Circuits IEEE International Conference - ISSCC
, 2008
Read Disturb in NROM Charge Trapping Non-Volatile Memory Device
N. Shainsky
,
I. Bloom
,
Y. Shacham
,
B. Eitan
Conference:
Device Research Conference - DRC
, pp. 277-278, 2008
A New Twin Flash Cell for 2 and 4 Bit Operation at 63nm Feature Size
N. Nagel
,
T. Muller
,
M. Isler
,
V. Pissors
,
J.-U. Sachse
,
D. Manger
,
D. Caspary
,
S. Parascandola
,
D. Olligs
,
H. Boubekeur
,
F. Heinrichsdorff
,
L. Bach
B. Eitan
http://academic.research.microsoft.com/io.ashx?type=5&id=50565789&selfId1=401777&selfId2=0&maxNumber=12&query=
Conference:
International Symposium on VLSI Technology, Systems and Applications - VLSI-TSA
, pp. 1-2, 2007
Sort by:
Citations
(424 times by 252 publications)
A Highly Punchthrough-Immune Array Architecture and Program Method for Floating-Gate NOR-Type Nonvolatile Memory
Wen-Jer Tsai
,
Tien Fan Ou
,
Cheng-Hsien Cheng
,
Chun-Yuan Lu
,
J. S. Huang
,
S. G. Yan
,
C. C. Cheng
,
Ping Hung Tsai
,
C. S. Hung
,
T. K. Chu
,
C. M. Yih
,
Tao Cheng Lu
http://academic.research.microsoft.com/io.ashx?type=5&id=51178466&selfId1=401777&selfId2=0&maxNumber=12&query=
Journal:
IEEE Transactions on Electron Devices - IEEE TRANS ELECTRON DEVICES
, vol. 58, no. 4, pp. 945-952, 2011
A Novel Random Telegraph Signal Method to Study Program/Erase Charge Lateral Spread and Retention Loss in a SONOS Flash Memory
Huan-Chi Ma
,
You-Liang Chou
,
Jung-Piao Chiu
,
Yueh-Ting Chung
,
Tung-Yang Lin
,
Tahui Wang
,
Yuan-Peng Chao
,
Kuang-Chao Chen
,
Chih-Yuan Lu
Journal:
IEEE Transactions on Electron Devices - IEEE TRANS ELECTRON DEVICES
, vol. 58, no. 3, pp. 623-630, 2011
Effect of annealing treatments on photoluminescence and charge storage mechanism in silicon-rich SiN x :H films
Bhabani Shankar Sahu
,
Florian Delachat
,
Abdelilah Slaoui
,
Marzia Carrada
,
Gerald Ferblantier
,
Dominique Muller
Journal:
Nanoscale Research Letters - NANOSCALE RES LETT
, vol. 6, no. 1, pp. 1-10, 2011
Performance Improvement of a Virtual-Ground Nonvolatile Charge-Trap Storage nor-Type Memory Cell With Optimized Junction Dosage for 45-nm Generation Node
T. F. Ou
,
W. C. Tzeng
,
C. H. Tsai
,
G. D. Lee
,
S. H. Ku
,
C. H. Liu
,
K. W. Liu
,
N. K. Zous
,
S. W. Huang
,
M. S. Chen
,
W. P. Lu
,
K. C. Chen
http://academic.research.microsoft.com/io.ashx?type=5&id=51181985&selfId1=401777&selfId2=0&maxNumber=12&query=
Journal:
IEEE Electron Device Letters - IEEE ELECTRON DEV LETT
, vol. 32, no. 6, pp. 734-736, 2011
A Novel Test Flow for One-Time-Programming Applications of NROM Technology
Mango C.-T. Chao
,
Ching-Yu Chin
,
Yao-Te Tsou
,
Chi-Min Chang
Journal:
IEEE Transactions on Very Large Scale Integration Systems - VLSI
, vol. 19, no. 12, pp. 2170-2183, 2011
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