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Co-authors
(94)
Kenneth A. LaBel
14
Hak Soo Kim
9
Anthony M. Phan
8
Anthony B. Sanders
7
Stephen P. Buchner
7
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(2)
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Authors
Dakai Chen
Dakai Chen,National Aeronautics and Space Administration, United States,Nuclear Engineering,Radiation
Edit
Dakai Chen
National Aeronautics and Space Administration, United States
Publications:
20
|
Citations:
34
Fields:
Nuclear Engineering
,
Radiation
View FAQ about top research areas and Fields of study
Collaborated with
94 co-authors
from 2004 to 2011
|
Cited by
142 authors
Cumulative
Annual
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Publications
(20)
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RefWorks
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Recent Total Ionizing Dose and Displacement Damage Compendium of Candidate Electronics for NASA Space Systems
(
Citations: 1
)
Donna J. Cochran
,
Alvin J. Boutte
,
Michael J. Campola
,
Martin A. Carts
,
Megan C. Casey
,
Dakai Chen
,
Kenneth A. LaBel
,
Raymond L. Ladbury
,
Jean-Marie Lauenstein
,
Cheryl J. Marshall
,
Martha V. O'Bryan
,
Timothy R. Oldham
http://academic.research.microsoft.com/io.ashx?type=5&id=51155744&selfId1=44027709&selfId2=0&maxNumber=12&query=
Conference:
IEEE Radiation Effects Data Workshop - REDW
, pp. 1-10, 2011
Enhanced Low Dose Rate Sensitivity at Ultra-Low Dose Rates
Dakai Chen
,
Ronald Pease
,
Kirby Kruckmeyer
,
James Forney
,
Anthony Phan
,
Martin Carts
,
Stephen Cox
,
Sam Burns
,
Rafi Albarian
,
Bruce Holcombe
,
Bradley Little
,
James Salzman
http://academic.research.microsoft.com/io.ashx?type=5&id=56945768&selfId1=44027709&selfId2=0&maxNumber=12&query=
Journal:
IEEE Transactions on Nuclear Science - IEEE TRANS NUCL SCI
, vol. 58, no. 6, pp. 2983-2990, 2011
Recent Single Event Effects Compendium of Candidate Electronics for NASA Space Systems
Martha V. O'Bryan
,
Kenneth A. LaBel
,
Jonathan A. Pellish
,
Jean-Marie Lauenstein
,
Dakai Chen
,
Cheryl J. Marshall
,
Timothy R. Oldham
,
Hak S. Kim
,
Anthony M. Phan
,
Melanie D. Berg
,
Michael J. Campola
,
Anthony B. Sanders
http://academic.research.microsoft.com/io.ashx?type=5&id=51155745&selfId1=44027709&selfId2=0&maxNumber=12&query=
Conference:
IEEE Radiation Effects Data Workshop - REDW
, pp. 1-13, 2011
SEE transient response of Crane Electronics Single Output Point of Load DC-DC Converters
Anthony B. Sanders
,
Dakai Chen
,
Hak S. Kim
,
Anthony M. Phan
,
Bertrand Nkei
,
Stefan Kristjansson
Conference:
European Conference on Radiation and its Effects on Components and Systems - RADECS
, pp. 908-912, 2011
Effect of Radiation Exposure on the Retention of Commercial NAND Flash Memory
T. R. Oldham
,
D. Chen
,
M. Friendlich
,
M. A. Carts
,
C. M. Seidleck
,
K. A. LaBel
Journal:
IEEE Transactions on Nuclear Science - IEEE TRANS NUCL SCI
, vol. 58, no. 6, pp. 2904-2910, 2011
Sort by:
Citations
(34 times by 31 publications)
Recent Single Event Effects Compendium of Candidate Electronics for NASA Space Systems
Martha V. O'Bryan
,
Kenneth A. LaBel
,
Jonathan A. Pellish
,
Jean-Marie Lauenstein
,
Dakai Chen
,
Cheryl J. Marshall
,
Timothy R. Oldham
,
Hak S. Kim
,
Anthony M. Phan
,
Melanie D. Berg
,
Michael J. Campola
,
Anthony B. Sanders
http://academic.research.microsoft.com/io.ashx?type=5&id=51155745&selfId1=44027709&selfId2=0&maxNumber=12&query=
Conference:
IEEE Radiation Effects Data Workshop - REDW
, pp. 1-13, 2011
Analysis of Low Dose Rate Effects on Parasitic Bipolar Structures in CMOS Processes for Mixed-Signal Integrated Circuits
Kirby Kruckmeyer
,
James S. Prater
,
Bill Brown
,
Thang Trinh
Journal:
IEEE Transactions on Nuclear Science - IEEE TRANS NUCL SCI
, vol. 58, no. 3, pp. 1023-1031, 2011
Impact of within-wafer process variability on radiation response
Zhiyuan Hu
,
Zhangli Liu
,
Hua Shao
,
Zhengxuan Zhang
,
Bingxu Ning
,
Ming Chen
,
Dawei Bi
,
Shichang Zou
Journal:
Microelectronics Journal
, vol. 42, no. 6, pp. 883-888, 2011
Load resistor as a worst-case parameter to investigate single-event transients in analog electronic devices
I. Lopez-Calle
,
F. J. Franco
,
J. A. Agapito
,
J. G. Izquierdo
Conference:
Spanish Conference on Electron Devices - CDE
, 2011
Dielectric Relaxation and Charge Trapping Characteristics Study in Germanium Based MOS Devices With $\hbox{HfO}_{2}/\hbox{Dy}_{2}\hbox{O}_{3}$ Gate Stacks
Evangelos K. Evangelou
Journal:
IEEE Transactions on Electron Devices - IEEE TRANS ELECTRON DEVICES
, vol. 58, no. 10, pp. 3549-3558, 2011
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