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Co-authors
(9)
Guido Groeseneken
1
L. C. Zhao
1
Gerald P. Beyer
1
Henny Volders
1
Zsolt Tokei
1
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Authors
Gianni Giai Gischia
Gianni Giai Gischia,Engineering
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Gianni Giai Gischia
Publications:
2
|
Citations:
6
Fields:
Engineering
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Collaborated with
9 co-authors
from 2009 to 2010
|
Cited by
19 authors
Cumulative
Annual
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Publications
(2)
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Study of leakage mechanism and trap density in porous low-k materials
(
Citations: 2
)
Gianni Giai Gischia
,
Kristof Croes
,
Guido Groeseneken
,
Z. Tokei
,
V. Afanas'ev
,
L. Zhao
Published in 2010.
A new perspective of barrier material evaluation and process optimization
(
Citations: 4
)
L. Zhao
,
Z. Tikei
,
G. G. Gischia
,
H. Volders
,
G. Beyer
Conference:
Interconnect Technology, IEEE International Conference - IITC
, 2009
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Citations
(6 times by 4 publications)
Integration of TSVs, wafer thinning and backside passivation on full 300mm CMOS wafers for 3D applications
Anne Jourdain
,
Thibault Buisson
,
Alain Phommahaxay
,
Augusto Redolfi
,
Sarasvathi Thangaraju
,
Youssef Travaly
,
Eric Beyne
,
Bart Swinnen
Conference:
Electronic Components and Technology Conference - ECTC
, pp. 1122-1125, 2011
Comparison between intrinsic and integrated reliability properties of low-k materials
K. Croes
,
M. Pantouvaki
,
L. Carbonell
,
L. Zhao
,
G. P. Beyer
,
Zs. Tokei
Published in 2011.
Reliability limitations to the scaling of porous low-k dielectrics
Shou-Chung Lee
,
A. S. Oates
Published in 2011.
Study of leakage mechanism and trap density in porous low-k materials
(
Citations: 2
)
Gianni Giai Gischia
,
Kristof Croes
,
Guido Groeseneken
,
Z. Tokei
,
V. Afanas'ev
,
L. Zhao
Published in 2010.
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