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Co-authors
(6)
Pasi Tamminen
3
Hannu Salmela
1
Jaakko A. J. Paasi
1
Timo Tarvainen
1
Tuomas Reinvuo
1
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EOS/ESD
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Authors
Toni Viheriakoski
Toni Viheriakoski,Engineering
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Toni Viheriakoski
Publications:
4
|
Citations:
10
Fields:
Engineering
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Collaborated with
6 co-authors
from 2005 to 2011
|
Cited by
31 authors
Cumulative
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Publications
(4)
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Product specific ESD risk analysis
Pasi Tamminen
,
Toni Viheriakoski
Published in 2011.
Simulation and physics of charged board model for ESD
(
Citations: 5
)
Tuomas Reinvuo
,
Timo Tarvainen
,
Toni Viheriäkoski
Conference:
Electrical Overstress/Electrostatic Discharge Symposium - EOS/ESD
, 2007
Characterization of ESD risks in an assembly process by using component-level CDM withstand voltage
(
Citations: 1
)
Pasi Tamminen
,
Toni Viheriäkoski
Conference:
Electrical Overstress/Electrostatic Discharge Symposium - EOS/ESD
, 2007
ESD control in automated placement process
(
Citations: 4
)
Jaakko Paasi
,
Pasi Tamminen
,
Hannu Salmela
,
J.-P. Leskinen
,
T. Viheriakoski
Published in 2005.
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Citations
(10 times by 9 publications)
Relationship between moulding compounds and tribocharging in IC manufacturing and Tape & Reel shipment
Yorgos Christoforou
,
Paiboon Rattawat
,
Pitak Seantumpol
,
Arkhom Sukpitikul
,
Amar Mavinkurve
,
Leon Goumans
Published in 2011.
Product specific ESD risk analysis
Pasi Tamminen
,
Toni Viheriakoski
Published in 2011.
Design of toroidal current probe embedded in multi-layer printed circuit boards for electrostatic discharge(ESD) detection
Hajin Sung
,
Eakhwan Song
,
Myounghoi Kim
,
Yujeong Shim
,
Sunkyu Kong
,
Jonghwa Kwon
,
Joungho Kim
Conference:
Electrical Design of Advanced Packaging and Systems Symposium - EDAPS
, pp. 1-4, 2010
Modeling and measurement of board-level ESD from power/ground plane charged by low-voltage for investigation of decoupling capacitor effects in printed circuit boards (PCBs)
Hajin Sung
,
Myunghoi Kim
,
Woojin Lee
,
Changwook Yoon
,
Kyoungchoul Koo
,
Jonghwa Kwon
,
Joungho Kim
Published in 2010.
Chip-level and board-level CDM ESD tests on IC products
Ming-Dou Ker
,
Chih-Kuo Huang
,
Yuan-Wen Hsiao
,
Yong-Fen Hsieh
Conference:
International Symposium on Physical & Failure Analysis of Integrated Circuits - IPFA
, pp. 45-49, 2009
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