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Co-authors
(497)
Simon Deleonibus
30
Xavier Garros
29
Gilles Reimbold
29
Gerard Ghibaudo (Gérard Ghibaudo)
24
Barbara De Salvo
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Authors
Francois Martin
Francois Martin (François Martin),Atomic Energy Commission,Electrical & Electronic Engineering,Nanotechnology,Algorithms & Theory
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Francois Martin (François Martin)
Atomic Energy Commission
Publications:
129
|
Citations:
387
Fields:
Electrical & Electronic Engineering
,
Nanotechnology
,
Algorithms & Theory
View FAQ about top research areas and Fields of study
Collaborated with
497 co-authors
from 1988 to 2011
|
Cited by
1302 authors
Cumulative
Annual
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Publications
(129)
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UTBOX and ground plane combined with Al2O3 inserted in TiN gate for VT modulation in fully-depleted SOI CMOS transistors
C. Fenouillet-Beranger
,
P. Perreau
,
M. Casse
,
X. Garros
,
C. Leroux
,
F. Martin
,
R. Gassilloud
,
A. Bajolet
,
L. Tosti
,
S. Barnola
,
F. Andrieu
,
O. Weber
http://academic.research.microsoft.com/io.ashx?type=5&id=51054240&selfId1=52931232&selfId2=0&maxNumber=12&query=
Conference:
International Symposium on VLSI Technology, Systems and Applications - VLSI-TSA
, pp. 1-2, 2011
SiON and SiO 2/HfSiON gate oxides time dependent dielectric breakdown measurements at nanoscale in ultra high vacuum
P. Delcroix
,
S. Blonkowski
,
M. Kogelschatz
,
M. Rafik
,
O. Gourhant
,
D. JeanJean
,
R. Beneyton
,
D. Roy
,
X. Federspiel
,
F. Martin
,
X. Garros
,
H. Grampeix
http://academic.research.microsoft.com/io.ashx?type=5&id=49215583&selfId1=52931232&selfId2=0&maxNumber=12&query=
Journal:
Microelectronic Engineering - MICROELECTRON ENG
, vol. 88, no. 7, pp. 1376-1379, 2011
Study of defects in Al2O3 blocking layers of TANOS memories by atomistic simulation, electrical characterization and physico-chemical material analyses
L. Masoero
,
G. Molas
,
P. Blaise
,
J. P. Colonna
,
E. Vianello
,
L. Selmi
,
A. M. Papon
,
D. Lafond
,
F. Martin
,
M. Gely
,
C. Licitra
,
J. P. Barnes
http://academic.research.microsoft.com/io.ashx?type=5&id=51054254&selfId1=52931232&selfId2=0&maxNumber=12&query=
Conference:
International Symposium on VLSI Technology, Systems and Applications - VLSI-TSA
, pp. 1-2, 2011
Automatic image orientation detection with prior hierarchical content-based classification
Ivana Cingovska
,
Zoran Ivanovski
,
Francois Martin
Conference:
Image Processing, IEEE International Conference - ICIP
, pp. 2985-2988, 2011
Low leakage and low variability Ultra-Thin Body and Buried Oxide (UT2B) SOI technology for 20nm low power CMOS and beyond
(
Citations: 9
)
F. Andrieu
,
O. Weber
,
J. Mazurier
,
O. Thomas
,
J.-P. Noel
,
C. Fenouillet-Béranger
,
J.-P. Mazellier
,
P. Perreau
,
T. Poiroux
,
Y. Morand
,
T. Morel
,
S. Allegret
F. Martin
http://academic.research.microsoft.com/io.ashx?type=5&id=50931616&selfId1=52931232&selfId2=0&maxNumber=12&query=
Conference:
VLSI Technology, Symposium - VLSIT
, 2010
Sort by:
Citations
(387 times by 331 publications)
On the MOSFET Threshold Voltage Extraction by Transconductance and Transconductance-to-Current Ratio Change Methods: Part II—Effect of Drain Voltage
(
Citations: 1
)
Tamara Rudenko
,
Valeriya Kilchytska
,
Jean-Pierre Raskin
,
Alexey Nazarov
,
Denis Flandre
Journal:
IEEE Transactions on Electron Devices - IEEE TRANS ELECTRON DEVICES
, vol. 58, no. 12, pp. 4180-4188, 2011
Full Two-Dimensional Markov Chain Analysis of Thermal Soft Errors in Subthreshold Nanoscale CMOS Devices
(
Citations: 1
)
Pooya Jannaty
,
Florian Cosmin Sabou
,
R. Iris Bahar
,
Joseph Mundy
,
William R. Patterson
,
Alexander Zaslavsky
Journal:
IEEE Transactions on Device and Materials Reliability - IEEE TRANS DEVICE MATER RELIA
, vol. 11, no. 1, pp. 50-59, 2011
Work-Function-Tuned TiN Metal Gate FDSOI Transistors for Subthreshold Operation
(
Citations: 1
)
Steven A. Vitale
,
Jakub Kedzierski
,
Paul Healey
,
Peter W. Wyatt
,
Craig L. Keast
Journal:
IEEE Transactions on Electron Devices - IEEE TRANS ELECTRON DEVICES
, vol. 58, no. 2, pp. 419-426, 2011
Three-Dimensional Simulation of Charge-Trap Memory Programming—Part I: Average Behavior
(
Citations: 1
)
Salvatore Maria Amoroso
,
Alessandro Maconi
,
Aurelio Mauri
,
Christian Monzio Compagnoni
,
Alessandro S. Spinelli
,
Andrea L. Lacaita
Journal:
IEEE Transactions on Electron Devices - IEEE TRANS ELECTRON DEVICES
, vol. 58, no. 7, pp. 1864-1871, 2011
From Atomistic to Device Level Investigation of Hybrid Redox Molecular/Silicon Field-Effect Memory Devices
(
Citations: 1
)
Tiziana Pro
,
Julien Buckley
,
Régis Barattin
,
Adrian Calborean
,
Venera Aiello
,
Giuseppe Nicotra
,
Kai Huang
,
Marc Gély
,
Guillaume Delapierre
,
Eric Jalaguier
,
Florence Duclairoir
,
Nicolas Chevalier
http://academic.research.microsoft.com/io.ashx?type=5&id=27023535&selfId1=52931232&selfId2=0&maxNumber=12&query=
Journal:
IEEE Transactions on Nanotechnology - IEEE TRANS NANOTECHNOL
, vol. 10, no. 2, pp. 275-283, 2011
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