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Co-authors
(20)
Susan J. Harrington
2
Peter Ashburn
2
M. Abdel Hakim
2
William Redman-white
2
Stephen Thomas
2
Conferences
(4)
ICMTS
3
ULIS
1
ICSICT
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Authors
S. D. Connor
S. D. Connor,Computer Science,Electrical & Electronic Engineering
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S. D. Connor
Publications:
7
|
Citations:
3
Fields:
Computer Science
,
Electrical & Electronic Engineering
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Collaborated with
20 co-authors
from 1996 to 2010
|
Cited by
9 authors
Cumulative
Annual
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Publications
(7)
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Self-Aligned Silicidation of Surround Gate Vertical MOSFETs for Low Cost RF Applications
(
Citations: 1
)
M. M. A. Hakim
,
L. Tan
,
A. Abuelgasim
,
K. Mallik
,
S. Connor
,
A. Bousquet
,
C. H. de Groot
,
W. Redman-White
,
S. Hall
,
P. Ashburn
Journal:
IEEE Transactions on Electron Devices - IEEE TRANS ELECTRON DEVICES
, vol. 57, no. 12, pp. 3318-3326, 2010
Characterisation of CMOS compatible vertical MOSFETs with new architectures through EKV parameter extraction and RF measurement
L. Tan
,
M. M. A. Hakim
,
S. Connor
,
A. Bousquet
,
W. Redman-White
,
P. Ashburn
,
S. Hall
Conference:
International Conference on Ultimate Integration of Silicon - ULIS
, 2009
Automated on-wafer measurement of noise figure and base spreading resistance
S. D. Connor
,
S. J. Harrington
,
A. J. Manson
,
S. Nigrin
,
S. Thomas
,
M. C. Wilson
Conference:
International Conference on Solid-State and Integrated Circuit Technology - ICSICT
, 2004
A 12Volt, 12GHz Complementary Bipolar Technology for High Frequency Analogue Applications
M. C. Wilson
,
S. Nigrin
,
S. Harrington
,
S. Manson
,
S. Thomas
,
L. Benton
,
S. Connor
,
P. Osborne
Conference:
Solid-State Device Research European Conference - ESSDERC
, 2002
Measurement of `1/f' noise in narrow poly-silicon emitter bipolar transistor structures
(
Citations: 2
)
S. D. Connor
Conference:
IEEE International Conference on Microelectronic Test Structures - ICMTS
, 1998
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Citations
(3 times by 3 publications)
Improved Drive Current in RF Vertical MOSFETS Using Hydrogen Anneal
M. M. A. Hakim
,
A. Abuelgasim
,
L. Tan
,
C. H. de Groot
,
W. Redman-White
,
S. Hall
,
P. Ashburn
Journal:
IEEE Electron Device Letters - IEEE ELECTRON DEV LETT
, vol. 32, no. 3, pp. 279-281, 2011
MEASUREMENT CIRCUITS AND DATA PROCESSING FOR TRANSISTOR 1/F NOISE PARAMETER EXTRACTION
(
Citations: 2
)
M. Zeltins
,
I. Slaidins
Bipolar Junction Transistor 1/f Noise Simulation and Parameter Extraction Technique
M. Zeltins
,
I. Slaidins
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