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Co-authors
(78)
Paul D. Kirsch
11
Raj Jammy
10
ByoungHun Lee (이병헌)
9
Jeffrey Huang
9
H.-H. Tseng
8
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Authors
P. Sivasubramani
P. Sivasubramani,University of Texas Dallas,Electrical & Electronic Engineering,Nanotechnology
Edit
P. Sivasubramani
University of Texas Dallas
Publications:
15
|
Citations:
59
Fields:
Electrical & Electronic Engineering
,
Nanotechnology
View FAQ about top research areas and Fields of study
Collaborated with
78 co-authors
from 2004 to 2009
|
Cited by
284 authors
Cumulative
Annual
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Publications
(15)
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Gate first high-k/metal gate stacks with zero SiOx interface achieving EOT=0.59nm for 16nm application
(
Citations: 8
)
J. Huang
,
D. Heh
,
P. Sivasubramani
,
P. D. Kirsch
,
G. Bersuker
,
D. C. Gilmer
,
M. A. Quevedo-Lopez
,
M. M. Hussain
,
P. Majhi
,
P. Lysaght
,
N. Goel
,
C. Young
http://academic.research.microsoft.com/io.ashx?type=5&id=50780550&selfId1=53245889&selfId2=0&maxNumber=12&query=
Published in 2009.
La-doped metal/high-K nMOSFET for sub-32nm HP and LSTP application
C. S. Park
,
J. W. Yang
,
M. M. Hussain
,
C. Y. Kang
,
J. Huang
,
P. Sivasubramani
,
K. Tateiwa
,
Y. Harada
,
J. Barnett
,
C. Melvin
,
G. Bersuker
,
P. D. Kirsch
http://academic.research.microsoft.com/io.ashx?type=5&id=50767265&selfId1=53245889&selfId2=0&maxNumber=12&query=
Conference:
International Symposium on VLSI Technology, Systems and Applications - VLSI-TSA
, pp. 59-60, 2009
Mechanisms limiting EOT scaling and gate leakage currents of high-k/metal gate stacks directly on SiGe and a method to enable sub-1nm EOT
(
Citations: 4
)
J. Huang
,
P. D. Kirsch
,
J. Oh
,
S. H. Lee
,
J. Price
,
P. Majhi
,
H. R. Harris
,
D. C. Gilmer
,
D. Q. Kelly
,
P. Sivasubramani
,
G. Bersuker
,
D. Heh
http://academic.research.microsoft.com/io.ashx?type=5&id=50667134&selfId1=53245889&selfId2=0&maxNumber=12&query=
Conference:
VLSI Technology, Symposium - VLSIT
, 2008
Device and reliability improvement of HfSiON+LaOx/metal gate stacks for 22nm node application
(
Citations: 3
)
J. Huang
,
P. D. Kirsch
,
D. Heh
,
C. Y. Kang
,
G. Bersuker
,
M. Hussain
,
P. Majhi
,
P. Sivasubramani
,
D. C. Gilmer
,
N. Goel
,
M. A. Quevedo-Lopez
,
C. Young
http://academic.research.microsoft.com/io.ashx?type=5&id=50734820&selfId1=53245889&selfId2=0&maxNumber=12&query=
Conference:
International Electron Devices Meeting - IEDM
, pp. 1-4, 2008
The impact of la-doping on the reliability of low Vth high-k/metal gate nMOSFETs under various gate stress conditions
(
Citations: 3
)
C. Y. Kang
,
C. D. Young
,
J. Huang
,
P. Kirsch
,
D. Heh
,
P. Sivasubramani
,
H. K. Park
,
G. Bersuker
,
B. H. Lee
,
H. S. Choi
,
K. T. Lee
,
Y.-H. Jeong
http://academic.research.microsoft.com/io.ashx?type=5&id=50734836&selfId1=53245889&selfId2=0&maxNumber=12&query=
Conference:
International Electron Devices Meeting - IEDM
, pp. 1-4, 2008
Sort by:
Citations
(59 times by 57 publications)
Intrinsic Reliability improvement in Biaxially Strained SiGe p-MOSFETs
(
Citations: 1
)
Shweta Deora
,
Abhijeet Paul
,
R. Bijesh
,
Jeff Huang
,
Gerhard Klimeck
,
Gennadi Bersuker
,
Paul Kirsch
,
Raj Jammy
Journal:
IEEE Electron Device Letters - IEEE ELECTRON DEV LETT
, vol. 32, no. 3, pp. 255-257, 2011
Novel Nanophase-Switching ESD Protection
Lin Lin
,
Lijie Zhang
,
Xin Wang
,
Jian Liu
,
Hui Zhao
,
He Tang
,
Qiang Fang
,
Zitao Shi
,
Albert Wang
,
Ru Huang
,
Yuhua Cheng
Journal:
IEEE Electron Device Letters - IEEE ELECTRON DEV LETT
, vol. 32, no. 3, pp. 378-380, 2011
Statistical Threshold-Voltage Variability in Scaled Decananometer Bulk HKMG MOSFETs: A Full-Scale 3-D Simulation Scaling Study
Xingsheng Wang
,
Andrew R. Brown
,
Niza Idris
,
Stanislav Markov
,
Gareth Roy
,
Asen Asenov
Journal:
IEEE Transactions on Electron Devices - IEEE TRANS ELECTRON DEVICES
, vol. 58, no. 8, pp. 2293-2301, 2011
Effect of $\hbox{NH}_{3}$ Plasma Nitridation on Hot-Carrier Instability and Low-Frequency Noise in Gd-Doped High$ \kappa$ Dielectric nMOSFETs
Yu-Ting Chen
,
Kun-Ming Chen
,
Cheng-Li Lin
,
Wen-Kuan Yeh
,
Guo-Wei Huang
,
Chien-Ming Lai
,
Yi-Wen Chen
,
Che-Hua Hsu
,
Fon-Shan Huang
Journal:
IEEE Transactions on Electron Devices - IEEE TRANS ELECTRON DEVICES
, vol. 58, no. 3, pp. 812-818, 2011
Nano crossbar electrostatic discharge protection design
Jian Liu
,
Lijie Zhang
,
Xin Wang
,
Lin Lin
,
Zitao Shi
,
Albert Wang
,
Ru Huang
,
Gary Zhang
,
Shi-Jie Wen
,
Richard Wong
Conference:
Radio Frequency Integrated Circuits IEEE Symposium - RFIC
, pp. 1-4, 2011
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