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Co-authors
(6)
Tae Hoon Kim (김태훈)
1
Karthik Sarpatwari
1
Jeff Kessenich
1
Keith Morinville
1
De-Ping He
1
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IEEE ELECTRON DEV LETT
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Authors
Benjamin Millemon
Benjamin Millemon,Micron Technology,Electrical & Electronic Engineering
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Benjamin Millemon
Micron Technology
Publications:
1
|
Citations:
1
Fields:
Electrical & Electronic Engineering
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Collaborated with
6 co-authors
in 2011
|
Cited by
5 authors
Cumulative
Annual
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Publications
(1)
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Tunnel Oxide Nitridation Effect on the Evolution of $V_{t}$ Instabilities (RTS/QED) and Defect Characterization for Sub40-nm Flash Memory
(
Citations: 1
)
Taehoon Kim
,
Deping He
,
Keith Morinville
,
Karthik Sarpatwari
,
Benjamin Millemon
,
Akira Goda
,
Jeff Kessenich
Journal:
IEEE Electron Device Letters - IEEE ELECTRON DEV LETT
, vol. 32, no. 8, pp. 999-1001, 2011
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Citations
(1 time by 1 publication)
Extreme Short-Channel Effect on RTS and Inverse Scaling Behavior: Source–Drain Implantation Effect in 25-nm nand Flash Memory
Taehoon Kim
,
Nathan Franklin
,
Charan Srinivasan
,
Pranav Kalavade
,
Akira Goda
Journal:
IEEE Electron Device Letters - IEEE ELECTRON DEV LETT
, vol. 32, no. 9, pp. 1185-1187, 2011
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