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Co-authors
(6)
Wasfy B. Mikhael
2
Craig Hughes
2
Matthew T. Hunter
2
Nicholas Locken
2
David B. Chester
2
Conferences
(2)
AUTEST
4
MWSCAS
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Academic
Authors
Charna R. Parkey
Charna R. Parkey,University of Central Florida,Computer Science,Engineering
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Charna R. Parkey
University of Central Florida
Publications:
5
|
Citations:
3
Fields:
Computer Science
,
Engineering
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Collaborated with
6 co-authors
in 2011
|
Cited by
6 authors
Cumulative
Annual
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Publications
(5)
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A non-destructive high-voltage low-energy intermittent fault location system
(
Citations: 1
)
Michael Ballas
,
Nicholas Locken
,
Charna Parkey
,
Craig Hughes
Conference:
AUTOTESTCON, International Automatic Testing Conference - AUTEST
, pp. 78-86, 2011
Analyzing artifacts in the time domain waveform to locate wire faults
(
Citations: 1
)
Charna Parkey
,
Craig Hughes
,
Nicholas Locken
Conference:
AUTOTESTCON, International Automatic Testing Conference - AUTEST
, pp. 221-225, 2011
Modeling of jitter and its effects on time interleaved ADC conversion
(
Citations: 1
)
Charna R. Parkey
,
Wasfy B. Mikhael
,
David B. Chester
,
Matthew T. Hunter
Conference:
AUTOTESTCON, International Automatic Testing Conference - AUTEST
, pp. 367-372, 2011
Simulink modeling of analog to digital converters for post conversion correction development and evaluation
Charna R. Parkey
,
David B. Chester
,
Matthew T. Hunter
,
Wasfy B. Mikhael
Conference:
Midwest Symposium on Circuits and Systems - MWSCAS
, pp. 1-4, 2011
Rapid development and porting of new waveforms for Synthetic Instrumentation
Charna R. Parkey
Conference:
AUTOTESTCON, International Automatic Testing Conference - AUTEST
, pp. 22-25, 2011
Sort by:
Citations
(3 times by 3 publications)
A non-destructive high-voltage low-energy intermittent fault location system
(
Citations: 1
)
Michael Ballas
,
Nicholas Locken
,
Charna Parkey
,
Craig Hughes
Conference:
AUTOTESTCON, International Automatic Testing Conference - AUTEST
, pp. 78-86, 2011
Analyzing artifacts in the time domain waveform to locate wire faults
(
Citations: 1
)
Charna Parkey
,
Craig Hughes
,
Nicholas Locken
Conference:
AUTOTESTCON, International Automatic Testing Conference - AUTEST
, pp. 221-225, 2011
Simulink modeling of analog to digital converters for post conversion correction development and evaluation
Charna R. Parkey
,
David B. Chester
,
Matthew T. Hunter
,
Wasfy B. Mikhael
Conference:
Midwest Symposium on Circuits and Systems - MWSCAS
, pp. 1-4, 2011
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