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Co-authors
(5)
Cheng-Li Lin
2
Tsung-Kuei Kang
2
Shich-Chuan Wu
2
Pi-Chun Juan
1
Jia-Jun Hong
1
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(1)
IPFA
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Academic
Authors
Mei-Yuan Chou
Mei-Yuan Chou,Feng Chia University,Electrical & Electronic Engineering,Nanotechnology
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Mei-Yuan Chou
Feng Chia University
Publications:
2
|
Citations:
1
Fields:
Electrical & Electronic Engineering
,
Nanotechnology
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Collaborated with
5 co-authors
from 2009 to 2011
|
Cited by
13 authors
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Annual
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Publications
(2)
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Electrical characteristics and TDDB breakdown mechanism of N 2-RTA-treated Hf-based high-κ gate dielectrics
(
Citations: 1
)
Cheng-Li Lin
,
Mei-Yuan Chou
,
Tsung-Kuei Kang
,
Shich-Chuan Wu
Journal:
Microelectronic Engineering - MICROELECTRON ENG
, vol. 88, no. 6, pp. 950-958, 2011
Comparison of breakdown mechanism of HfO2 and HfSiOx high-k gate dielectrics with N2 RTA treatment on TDDB constant voltage stress
Cheng-Li Lin
,
Mei-Yuan Chou
,
Jia-Jun Hong
,
Tsung-Kuei Kang
,
Shich-Chuan Wu
,
Pi-Chun Juan
Conference:
International Symposium on Physical & Failure Analysis of Integrated Circuits - IPFA
, pp. 163-168, 2009
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Citations
(1 time by 1 publication)
Epitaxial ALD BeO: Efficient Oxygen Diffusion Barrier for EOT Scaling and Reliability Improvement
Jung Hwan Yum
,
Gennadi Bersuker
,
Tarik Akyol
,
D. A. Ferrer
,
Ming Lei
,
Keun Woo Park
,
Todd W. Hudnall
,
Mike C. Downer
,
Christopher W. Bielawski
,
Edward T. Yu
,
Jimmy Price
,
Jack C. Lee
http://academic.research.microsoft.com/io.ashx?type=5&id=51158142&selfId1=56827695&selfId2=0&maxNumber=12&query=
Journal:
IEEE Transactions on Electron Devices - IEEE TRANS ELECTRON DEVICES
, vol. 58, no. 12, pp. 4384-4392, 2011
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