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Co-authors
(328)
Marty R. Shaneyfelt
121
James Ralph Schwank
100
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42
F. W. Sexton
31
Gerald L. Hash
31
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Academic
Authors
Paul E. Dodd
Paul E. Dodd,Sandia National Laboratories,Nuclear Engineering,Radiation,Electrical & Electronic Engineering
Edit
Paul E. Dodd
Sandia National Laboratories
Publications:
187
|
Citations:
2141
Fields:
Nuclear Engineering
,
Radiation
,
Electrical & Electronic Engineering
View FAQ about top research areas and Fields of study
Collaborated with
328 co-authors
from 1990 to 2011
|
Cited by
2498 authors
Cumulative
Annual
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Publications
(187)
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RefWorks
Download
2011 IEEE Nuclear and Space Radiation Effects Conference Awards Comments by the Chairman
Ray Ladbury
,
E. DeIonno
,
W. Tong
,
J. Yang
,
R. Williams
,
P. Kuekes
,
J. Schwank
,
M. Shaneyfelt
,
P. Dodd
,
S. Swanson
,
D. McMorrow
,
J. Melinger
http://academic.research.microsoft.com/io.ashx?type=5&id=56945788&selfId1=61941&selfId2=0&maxNumber=12&query=
Journal:
IEEE Transactions on Nuclear Science - IEEE TRANS NUCL SCI
, vol. 58, no. 6, pp. 2548-2549, 2011
The Effects of Neutron Energy and High-Z Materials on Single Event Upsets and Multiple Cell Upsets
Michael Andrew Clemens
,
Brian D. Sierawski
,
Kevin M. Warren
,
Marcus H. Mendenhall
,
Nathaniel A. Dodds
,
Robert A. Weller
,
Robert A. Reed
,
Paul E. Dodd
,
Marty R. Shaneyfelt
,
James R. Schwank
,
Stephen A. Wender
,
Robert C. Baumann
Journal:
IEEE Transactions on Nuclear Science - IEEE TRANS NUCL SCI
, vol. 58, no. 6, pp. 2591-2598, 2011
Direct Comparison of Charge Collection in SOI Devices From Single-Photon and Two-Photon Laser Testing Techniques
James R. Schwank
,
Marty R. Shaneyfelt
,
Paul E. Dodd
,
Dale McMorrow
,
Gyorgy Vizkelethy
,
Véronique Ferlet-Cavrois
,
Pascale M. Gouker
,
Richard S. Flores
,
Jeffrey Stevens
,
Stephen B. Buchner
,
Scott M. Dalton
,
Scot E. Swanson
Journal:
IEEE Transactions on Nuclear Science - IEEE TRANS NUCL SCI
, vol. 58, no. 3, pp. 820-826, 2011
Comparison of Single and Two-Photon Absorption for Laser Characterization of Single-Event Upsets in SOI SRAMs
James R. Schwank
,
Marty R. Shaneyfelt
,
Paul E. Dodd
,
Dale McMorrow
,
Jeffrey H. Warner
,
Véronique Ferlet-Cavrois
,
Pascale M. Gouker
,
Joseph S. Melinger
,
Jonathan A. Pellish
,
Kenneth P. Rodbell
,
David F. Heidel
,
Paul W. Marshall
http://academic.research.microsoft.com/io.ashx?type=5&id=56945770&selfId1=61941&selfId2=0&maxNumber=12&query=
Journal:
IEEE Transactions on Nuclear Science - IEEE TRANS NUCL SCI
, vol. 58, no. 6, pp. 2968-2975, 2011
Single-Event Upsets and Distributions in Radiation-Hardened CMOS Flip-Flop Logic Chains
Paul E. Dodd
,
Marty R. Shaneyfelt
,
Richard S. Flores
,
James R. Schwank
,
Thomas A. Hill
,
Dale McMorrow
,
Gyorgy Vizkelethy
,
Scot E. Swanson
,
Scott M. Dalton
Journal:
IEEE Transactions on Nuclear Science - IEEE TRANS NUCL SCI
, vol. 58, no. 6, pp. 2695-2701, 2011
Sort by:
Citations
(2141 times by 1264 publications)
Policy transfer and learning in the field of transport: A review of concepts and evidence
(
Citations: 3
)
Greg Marsden
,
Dominic Stead
Journal:
Transport Policy - TRANSP POLICY
, vol. 18, no. 3, pp. 492-500, 2011
MC-ORACLE: A tool for predicting Soft Error Rate
(
Citations: 3
)
Frédéric Wrobel
,
Frédéric Saigné
Journal:
Computer Physics Communications
, vol. 182, no. 2, pp. 317-321, 2011
Accurate Modeling of Single-Event Transients in a SiGe Voltage Reference Circuit
(
Citations: 2
)
Kurt A. Moen
,
Laleh Najafizadeh
,
Jung Seungwoo
,
Ashok Raman
,
Marek Turowski
,
John D. Cressler
Journal:
IEEE Transactions on Nuclear Science - IEEE TRANS NUCL SCI
, vol. 58, no. 3, pp. 877-884, 2011
Modeling and Mitigating Transient Errors in Logic Circuits
(
Citations: 3
)
Ilia Polian
,
John P. Hayes
,
Sudhakar M. Reddy
,
Bernd Becker
Journal:
IEEE Transactions on Dependable and Secure Computing - TDSC
, vol. 8, no. 4, pp. 537-547, 2011
Accelerated aging with electrical overstress and prognostics for power MOSFETs
(
Citations: 1
)
Sankalita Saha
,
Jose. R. Celaya
,
Vladislav Vashchenko
,
Shompa Mahiuddin
,
Kai. F. Goebel
Conference:
IEEE Energytech - EnergyTech
, 2011
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