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Co-authors
(15)
Duane S. Boning
4
Karthik Balakrishnan
2
Nigel Drego
2
Ali Farahanchi
2
Daniel Truque
2
Conferences
(2)
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Academic
Authors
Ajay Somani
Ajay Somani,Massachusetts Institute of Technology,Hardware & Architecture,Electrical & Electronic Engineering
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Ajay Somani
Massachusetts Institute of Technology
Publications:
4
|
Citations:
19
Fields:
Hardware & Architecture
,
Electrical & Electronic Engineering
View FAQ about top research areas and Fields of study
Collaborated with
15 co-authors
from 2006 to 2008
|
Cited by
58 authors
Cumulative
Annual
Sort by:
Publications
(4)
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Variation
(
Citations: 8
)
Duane S. Boning
,
Karthik Balakrishnan
,
Hong Cai
,
Nigel Drego
,
Ali Farahanchi
,
Karen M. Gettings
,
Lim Daihyun
,
Ajay Somani
,
Hayden Taylor
,
Daniel Truque
,
Xie Xiaolin
Journal:
IEEE Transactions on Semiconductor Manufacturing - IEEE TRANS SEMICONDUCT MANUF
, vol. 21, no. 1, pp. 63-71, 2008
Variation
(
Citations: 9
)
Duane S. Boning
,
Karthik Balakrishnan
,
Hong Cai
,
Nigel Drego
,
Ali Farahanchi
,
Karen Gettings
,
Daihyun Lim
,
Ajay Somani
,
Hayden Taylor
,
Daniel Truque
,
Xiaolin Xie
Conference:
International Symposium on Quality Electronic Design - ISQED
, pp. 15-20, 2007
Environmental Impact Evaluation Methodology for Emerging Silicon-Based Technologies
(
Citations: 2
)
Ajay Somani
,
Philip Gschwend
,
Sarah Jane White
,
Duane Boning
,
Rafael Reif
Conference:
IEEE International Symposium on Electronics and the Environment - ISSST
, pp. 258-263, 2006
Spatial Analysis of Ring Oscillator Devices
A. Somani
,
L. W. Teo
,
D. S. Boning
Sort by:
Citations
(19 times by 15 publications)
Statistical Design Framework of Submicron Flip-Flop Circuits Considering Process Variations
Sayed Alireza Sadrossadat
,
Hassan Mostafa
,
Mohab Anis
Journal:
IEEE Transactions on Semiconductor Manufacturing - IEEE TRANS SEMICONDUCT MANUF
, vol. 24, no. 1, pp. 69-79, 2011
New tools and methodology for advanced parametric and defect structure test
(
Citations: 2
)
Raphael Robertazzi
,
Louis Medina
,
Emesto Shiling
,
Garry Moore
,
Ronald Geiger
,
Jiun-Hsin Liao
,
John Williamson
Conference:
International Test Conference - ITC
, pp. 1-10, 2010
Investigation of Pattern Effects in Rapid Thermal Processing Technology: Modeling and Experimental Results
(
Citations: 1
)
Florian Cacho
,
H. Bono
,
Remi Beneyton
,
B. Dumont
,
R. Bianchini
,
Alexis Colin
,
Vincent Fiori
,
Pierre Morin
Journal:
IEEE Transactions on Semiconductor Manufacturing - IEEE TRANS SEMICONDUCT MANUF
, vol. 23, no. 2, pp. 303-310, 2010
Analysis and Application of Environmental Impact Evaluation System for Biomass Power Generation Based on TOPSIS Method
Dong-xiao Niu
,
Mian Xing
,
Ya-nan Wei
,
Jian-qing Li
Conference:
International Conference on Challenges in Environmental Science and Computer Engineering - CESCE
, 2010
Digital design at a crossroads How to make statistical design methodologies industrially relevant
(
Citations: 3
)
Ulf Schlichtmann
,
Manuel Schmidt
,
Harald Kinzelbach
,
Michael Pronath
,
Volker Glöckel
,
Manfred Dietrich
,
Uwe Eichler
,
Joachim Haase
Conference:
Design, Automation, and Test in Europe - DATE
, pp. 1542-1547, 2009
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