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Co-authors
(328)
Chi-Chang Hu
160
Mansun Chan
72
C. Hu
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Yiu Chung Cheng
34
Philip C. H. Chan
26
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Authors
Ping-keung Ko
Ping-keung Ko,Hong Kong University of Science & Technology,Electrical & Electronic Engineering,Hardware & Architecture,Cell Biology
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Ping-keung Ko
Hong Kong University of Science & Technology
Publications:
379
|
Citations:
4677
Fields:
Electrical & Electronic Engineering
,
Hardware & Architecture
,
Cell Biology
View FAQ about top research areas and Fields of study
Collaborated with
328 co-authors
from 1975 to 2005
|
Cited by
7304 authors
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Publications
(379)
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RefWorks
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Implementing a Successful Business Model for the IC Industry in China
P. K. Ko
Conference:
IEEE Conference on Electron Devices and Solid-State Circuits - EDSSC
, 2005
Modeling the floating-body effects of fully depleted, partially depleted, and body-grounded SOI MOSFETs
(
Citations: 10
)
Mansun Chan
,
Pin Su
,
Hui Wan
,
Chung-Hsun Lin
,
Samuel K.-H. Fung
,
Ali M. Niknejad
,
Chenming Hu
,
Ping K. Ko
Journal:
Solid-state Electronics - SOLID STATE ELECTRON
, vol. 48, no. 6, pp. 969-978, 2004
Quasi2D Compact Modeling for Double-Gate MOSFET
(
Citations: 2
)
Mansun Chan
,
Tze Yin Man
,
Jin He
,
Xuemei Xi
,
Chung-Hsun Lin
,
Xinnan Lin
,
Ping K. Ko
,
Ali M. Niknejad
,
Chenming Hu
Published in 2004.
High frequency characteristics of MOSFETs with compact waffle layout
(
Citations: 1
)
Wen Wu
,
Sang Lam
,
Ping K. KO
,
Mansun Chan
Conference:
Solid-State Device Research European Conference - ESSDERC
, 2004
Characterization and modeling of waffle MOSFETs for high frequency applications
(
Citations: 1
)
Wen Wu
,
Sang Lam
,
P. K. Ko
,
Mansun Chan
Conference:
International Conference on Solid-State and Integrated Circuit Technology - ICSICT
, 2004
Sort by:
Citations
(4677 times by 3441 publications)
Analytical modelling of inverse narrow width effect for narrow channel STI MOSFETs
Srabanti Pandit
,
C. K. Sarkar
Journal:
International Journal of Electronics - INT J ELECTRON
, vol. 99, no. 3, pp. 361-377, 2012
Analog circuit reliability in sub-32 nanometer CMOS: Analysis and mitigation
(
Citations: 2
)
Georges Gielen
,
Elie Maricau
,
Pieter De Wit
Published in 2011.
Comparison of 65nm LP bulk and LP PD-SOI with adaptive power gate body bias for an LDPC codec
(
Citations: 2
)
Julien Le Coz
,
Philippe Flatresse
,
Sylvain Engels
,
Alexandre Valentian
,
Marc Belleville
,
Christine Raynaud
,
Damien Croain
,
Pascal Urard
Conference:
Solid-State Circuits IEEE International Conference - ISSCC
, pp. 336-337, 2011
Characterization of an Oxide Trap Leading to Random Telegraph Noise in Gate-Induced Drain Leakage Current of DRAM Cell Transistors
(
Citations: 2
)
Byoungchan Oh
,
Heung-Jae Cho
,
Heesang Kim
,
Younghwan Son
,
Taewook Kang
,
Sunyoung Park
,
Seunghyun Jang
,
Jong-Ho Lee
,
Hyungcheol Shin
Journal:
IEEE Transactions on Electron Devices - IEEE TRANS ELECTRON DEVICES
, vol. 58, no. 6, pp. 1741-1747, 2011
Stochastic circuit reliability analysis
(
Citations: 3
)
Elie Maricau
,
Georges Gielen
Published in 2011.
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