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Authors
(1948)
Bunji Mizuno
17
Hi-Deok Lee
13
Hiroshi Iwai
13
Tsutomu Nagayama
13
Masayasu Tanjyo
13
Yuji C. Sasaki
12
Nariaki Hamamoto
12
Ru Chih C. Huang
11
Jyi-Tsong Lin
11
Takayuki Aoyama
11
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(529)
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Academic
Conferences
IWJT - International Workshop on Junction Technology
International Workshop on Junction Technology,IWJT,Engineering
IWJT - International Workshop on Junction Technology
Publications: 524
|
Citation Count: 206 (Self-Citation: 12)
Year Range: 2000-2012
Fields of study:
Engineering
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Publications
(524)
Process match between DSA and LSA for ultra-shallow junction formation
Yonggen Hea
,
Bing Wul
,
Guobin Yul
,
Yong Chenl
,
Hailong Liul
,
Wei Lu
,
Jingang Wu
,
David Wei Zhang
,
Chenyu Wang
,
Ji Yue Tang
,
Ganming Zhao
Conference:
International Workshop on Junction Technology - IWJT
, 2012
Implantation-induced structural defects in highly activated USJs: Boron precipitation and trapping in pre-amorphised silicon
F. Cristiano
,
Z. Essa
,
Y. Qiu
,
Y. Spiegel
,
F. Torregrosa
,
J. Duchaine
,
P. Boulenc
,
C. Tavernier
,
O. Cojocaru
,
D. Blavette
,
D. Mangelinck
,
P. F. Fazzini
http://academic.research.microsoft.com/io.ashx?type=5&id=56973431&selfId1=4235&selfId2=0&maxNumber=12&query=
Conference:
International Workshop on Junction Technology - IWJT
, 2012
Application of cluster Ion (carbon) implantation for strain applications
Karuppanan Sekar
,
Nobuhiro Tokoro
,
Hiroshi Onoda
,
Yoshiki Nakashima
,
Yuji Koga
,
Nariaki Hamamoto
,
Tsutomu Nagayama
,
Joshua Herman
,
Steve Novak
,
Martin Rodgers
,
Daniel Franca
,
Saikumar Vivekanand
Conference:
International Workshop on Junction Technology - IWJT
, 2012
Improving device performance and variability for 28nm and beyond low power SoC technology using advanced implant solutions
C. L. Yang
,
C. I. Li
,
G. P. Lin
,
C. H. Tsai
,
Y. S. Huang
,
C. Fu
,
T. Y. Lu
,
H. Y. Wang
,
W. J. Chen
,
Y. L. Chin
,
M. Chan
,
J. Y. Wu
http://academic.research.microsoft.com/io.ashx?type=5&id=56973406&selfId1=4235&selfId2=0&maxNumber=12&query=
Conference:
International Workshop on Junction Technology - IWJT
, 2012
Applications of site-specific scanning spreading resistance microscopy (SSRM) to failure analysis of production lines
Youhei Hayase
,
Keiryo Hara
,
Shinsuke Ogata
,
Li Zhang
,
Haruko Akutsu
,
Michio Kurihara
,
Kenji Norimatsu
,
Shinji Nagamine
Conference:
International Workshop on Junction Technology - IWJT
, 2012