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Characteristic impedance extraction using calibration comparison

Characteristic impedance extraction using calibration comparison,10.1109/22.971652,IEEE Transactions on Microwave Theory and Techniques,Servaas Vanden

Characteristic impedance extraction using calibration comparison   (Citations: 3)
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A robust line impedance identification method is presented in this paper. It determines the characteristic impedance of on-wafer thru-line-reflect (TLR) standards measured after an initial off-wafer line-reflect-match or TLR calibration. The only assumption made is that the obtained trans-wafer error boxes are a cascade of a symmetric probe-related disturbance and a change in reference impedance. The proposed method yields an unbiased estimate of the complex characteristic impedance. Results from coplanar lines on a medium resistivity silicon substrate support the made assumption
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