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(1)
Analog Circuits
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Device mismatch and tradeoffs in the design of analog circuits
Device mismatch and tradeoffs in the design of analog circuits,10.1109/JSSC.2005.848021,IEEE Journal of Solidstate Circuits,P. R. Kinget
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Device mismatch and tradeoffs in the design of analog circuits
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Citations: 104
)
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P. R. Kinget
Journal:
IEEE Journal of Solidstate Circuits  IEEE J SOLIDSTATE CIRCUITS
, vol. 40, no. 6, pp. 12121224, 2005
DOI:
10.1109/JSSC.2005.848021
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Citation Context
(74)
...It is well known that to some extent, power and area can be traded for lower variation by using a bigger device with reduced mismatch [
30
]...
Xuan Zhang
,
et al.
A LowPower ProcessandTemperatureCompensated Ring Oscillator with A...
...mismatch generally dominates mismatch and we can write [
52
]...
...In [
52
], it is demonstrated that CMOS device mismatch imposes a minimal power limit that is typically 1 to 2 orders of magnitude greater than the...
Gokce Keskin
,
et al.
Exploiting Combinatorial Redundancy for Offset Calibration in Flash AD...
...Using (17), it is possible to estimate the minimum acceptable size of transistors to have a positive noise margin, i.e., NM . Using [20], [
21
], and assuming that variations on threshold voltage of PMOS and NMOS devices are uncorrelated and assuming that the width of PMOS device is times larger than NMOS transistors, then the effective width and length of NMOS device should be larger than...
Armin Tajalli
,
et al.
Design Tradeoffs in UltraLowPower Digital Nanoscale CMOS
...As CMOS devices enter the nanoscale region, difficulty with matching in the presence of increased variability becomes more critical [
3
], necessitating some form of calibration...
...However, as described in [
3
], this can impose severe die area and power dissipation penalties since the required capacitor size is often much greater than the limit set by noise...
John A. McNeill
,
et al.
AllDigital Background Calibration of a Successive Approximation ADC U...
...Reference curves, measured inhouse, were used to fit the model parameters (Fig. 3). For variability, a compact model card independent approach was used by extracting a twoparameter (ΔVt, Δβ/β) variation model from the measured devices, and incorporating these two parameters as variation sources at the circuit level [5][
6
]...
P. Zuber
,
et al.
Variability and technology aware SRAM Product yield maximization
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Sort by:
Citations
(104)
A LowPower ProcessandTemperatureCompensated Ring Oscillator with AdditionBased Current Source
(
Citations: 3
)
Xuan Zhang
,
Alyssa B. Apsel
Journal:
IEEE Transactions on Circuits and Systems Iregular Papers  IEEE TRANS CIRCUIT SYSTI
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Exploiting Combinatorial Redundancy for Offset Calibration in Flash ADCs
(
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JeanOlivier Plouchart
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Lawrence Pileggi
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IEEE Journal of Solidstate Circuits  IEEE J SOLIDSTATE CIRCUITS
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Design Tradeoffs in UltraLowPower Digital Nanoscale CMOS
(
Citations: 1
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Armin Tajalli
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Yusuf Leblebici
Journal:
IEEE Transactions on Circuits and Systems Iregular Papers  IEEE TRANS CIRCUIT SYSTI
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AllDigital Background Calibration of a Successive Approximation ADC Using the “Split ADC” Architecture
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