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Two-Stage Fault Location

Two-Stage Fault Location,10.1109/TEST.1991.519762,Paul G. Ryan,Shishpal Rawat,W. Kent Fuchs

Two-Stage Fault Location   (Citations: 64)
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A two-stage procedure for locating VLSI faults is presented. The approach utilizes dynamic fault dictionaries, test set partitioning, and reduced fault lists to achieve a reduction in size and complexity over classic static fault dictionaries. An industrial implementation is reported in which faults were injected and diagnosed in a VLSI chip and the perjiormunce of two-stage fault location was measured.
Conference: International Test Conference - ITC , pp. 963-968, 1991
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