Two-Stage Fault Location

Two-Stage Fault Location,10.1109/TEST.1991.519762,Paul G. Ryan,Shishpal Rawat,W. Kent Fuchs

Two-Stage Fault Location   (Citations: 64)
BibTex | RIS | RefWorks Download
A two-stage procedure for locating VLSI faults is presented. The approach utilizes dynamic fault dictionaries, test set partitioning, and reduced fault lists to achieve a reduction in size and complexity over classic static fault dictionaries. An industrial implementation is reported in which faults were injected and diagnosed in a VLSI chip and the perjiormunce of two-stage fault location was measured.
Conference: International Test Conference - ITC , pp. 963-968, 1991
Cumulative Annual
View Publication
The following links allow you to view full publications. These links are maintained by other sources not affiliated with Microsoft Academic Search.
Sort by: