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Optical emission spectroscopy of various materials irradiated by soft x-ray free-electron laser

Optical emission spectroscopy of various materials irradiated by soft x-ray free-electron laser,J. Cihelka,L. Juha,J. Chalupsk,F. B. Rosmej,O. Renner,

Optical emission spectroscopy of various materials irradiated by soft x-ray free-electron laser  
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J. Cihelka, L. Juha, J. Chalupsk, F. B. Rosmej, O. Renner, K. Saksl, V. Hájková, L. Vy, E. Galtier, R. Schott, A. R. Khorsand, D. Rileyhttp://academic.research.microsoft.com/io.ashx?type=5&id=13659352&selfId1=0&selfId2=0&maxNumber=12&query=
The beam of the Free-Electron Laser in Hamburg (FLASH) was focused by a grazing incidence elliptical mirror (32.5 nm and 13.5 nm) and an off-axis parabolic mirror coated with a Si/Mo multilayer (13.5 nm) to 20-micron and 1-micron spot, respectively. The grazing incidence and normal incidence focusing of ~25-fs pulses with an energy of 10 ! J resulted in an irradiance of 10 13 W/cm 2 and 10
Published in 2010.
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