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Keywords
(9)
Charged Couple Device
Electric Field
Energy Conversion
Image Resolution
Integrated Circuit
Light Scattering
Optical Imaging
Semiconductor Devices
Spatial Resolution
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Photosensing arrays with improved spatial resolution
Photosensing arrays with improved spatial resolution,10.1109/T-ED.1978.19053,IEEE Transactions on Electron Devices,THEODORE I. KAMINS,GODFREY T. FONG
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Photosensing arrays with improved spatial resolution
(
Citations: 10
)
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THEODORE I. KAMINS
,
GODFREY T. FONG
The
spatial resolution
obtainable in a photosensing array used for
optical imaging
may be limited by the diffusion of photogenerated carriers within a uniformly doped semiconductor even if other components of the optical system are optimized and scattered light is reduced. A technique has been developed to improve the
spatial resolution
for critical applications by incorporating subsurface electric fields that accelerate the photogenerated carriers toward or away from the surface so that the carriers are prevented from diffusing to distant photosensing elements. The subsurface fields are obtained by incorporating suitable dopant concentration gradients into the structure. In one structure fabricated the subsurface field was formed by using a heavily doped buried layer and a lightly doped epitaxial film over a lightly doped substrate, all of the same conductivity type. This structure is compatible with the incorporation of other
semiconductor devices
in the same monolithic substrate. The technique has been applied to an array of photodiodes in a silicon integrated circuit, but the principle is directly applicable to other types of photosensing arrays, such as charge-coupled devices (CCD's), and other semiconductor materials.
Journal:
IEEE Transactions on Electron Devices - IEEE TRANS ELECTRON DEVICES
, vol. 25, no. 2, pp. 154-159, 1978
DOI:
10.1109/T-ED.1978.19053
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Citation Context
(3)
...represents the effects of photogeneration and diffusion of photocarriers [
3
]‐[12]...
Ji Soo Lee
,
et al.
Characterization and deblurring of lateral crosstalk in CMOS image sen...
...This phenomenon, which has bothered the operation of the photosensing arrays in the CCD design [
12
], can be used to implement the smooth function of the vertebrate retina...
Chung-Yu Wu
,
et al.
A new structure of the 2-D silicon retina
...Decreasing dimensions along with increasing number of elements in imaging photodiode arrays result in degradation of spatial resolution and sensitivity due to lateral transport(
1-5
)...
D. Levy
,
et al.
Three-dimensional analytical model for photovoltaic detector arrays
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Citations: 19
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Journal:
IEEE Transactions on Electron Devices - IEEE TRANS ELECTRON DEVICES
, vol. 15, no. 4, pp. 196-201, 1968
Imaging devices using the charge-coupled concept
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Proceedings of The IEEE - PIEEE
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Journal:
IEEE Transactions on Electron Devices - IEEE TRANS ELECTRON DEVICES
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Intrinsic Optical Absorption in Single-Crystal Germanium and Silicon at 77°K and 300°K
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Physical Review - PHYS REV X
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Citations
(10)
Analysis of CMOS Photodiodes. II. Lateral photoresponse
(
Citations: 10
)
Ji Soo Lee
,
Richard I. Hornsey
,
David Renshaw
Journal:
IEEE Transactions on Electron Devices - IEEE TRANS ELECTRON DEVICES
, vol. 50, no. 5, pp. 1239-1245, 2003
Analysis of CMOS Photodiodes. I. Quantum efficiency
(
Citations: 10
)
Ji Soo Lee
,
Richard I. Hornsey
,
David Renshaw
Journal:
IEEE Transactions on Electron Devices - IEEE TRANS ELECTRON DEVICES
, vol. 50, no. 5, pp. 1233-1238, 2003
Characterization and deblurring of lateral crosstalk in CMOS image sensors
(
Citations: 6
)
Ji Soo Lee
,
Joey Shah
,
M. Ed Jernigan
,
Richard I. Hornsey
Journal:
IEEE Transactions on Electron Devices - IEEE TRANS ELECTRON DEVICES
, vol. 50, no. 12, pp. 2361-2368, 2003
Characterization of crosstalk between CMOS photodiodes
(
Citations: 11
)
I. Brouk
,
Yael Nemirovsky
,
Stefan Lachowicz
,
Edward Gluszak
,
Steven Hinckley
,
Kamran Eshraghian
Journal:
Solid-state Electronics - SOLID STATE ELECTRON
, vol. 46, no. 1, pp. 53-59, 2002
A new structure of the 2-D silicon retina
(
Citations: 33
)
Chung-Yu Wu
,
Chin-Fong Chiu
Journal:
IEEE Journal of Solid-state Circuits - IEEE J SOLID-STATE CIRCUITS
, vol. 30, no. 8, pp. 890-897, 1995