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Detailed analysis of secondary ions' effect for the calculation of neutron-induced SER in SRAMs

Detailed analysis of secondary ions' effect for the calculation of neutron-induced SER in SRAMs,10.1109/23.983156,IEEE Transactions on Nuclear Science

Detailed analysis of secondary ions' effect for the calculation of neutron-induced SER in SRAMs   (Citations: 31)
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A new method of neutron soft error rate calculation derived from device simulations and nuclear physics results is presented. The main inputs are only a critical linear energy transfer, a critical charge, and layout dimensions. No classical sensitive volume size is needed because the extension of the sensitive region is described in terms of the variation of the ion efficacy versus its position with respect to the sensitive drain
Journal: IEEE Transactions on Nuclear Science - IEEE TRANS NUCL SCI , vol. 48, no. 6, pp. 1953-1959, 2001
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