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Keywords
(4)
Atomic Force Microscope
Cantilever Beam
Scanning Tunneling Microscope
Scanning Tunneling Microscopy
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Atomic force microscope
Atomic force microscope,10.1103/PhysRevLett.56.930,Physical Review Letters,G. Binnig,C. F. Quate,Ch. Gerber
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Atomic force microscope
(
Citations: 2217
)
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G. Binnig
,
C. F. Quate
,
Ch. Gerber
A
scanning tunneling microscope
(STM), which is capable of measuring forces as small as 10 to the -18th N, is described. Application of the STM to observations of insulator surfaces on the atomic scale is discussed in detail. The results of preliminary tests of the system indicate a lateral resolution of 30 A and a vertical resolution of less than 1 A. A schematic diagram of the microscope system is provided.
Journal:
Physical Review Letters - PHYS REV LETT
, vol. 56, no. 9, pp. 930-933, 1986
DOI:
10.1103/PhysRevLett.56.930
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link.aps.org
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Citation Context
(525)
...as a scanner working on two or three axis [
33
]...
Micky Rakotondrabe
,
et al.
Robust Feedforward-Feedback Control of a Nonlinear and Oscillating 2DO...
...Scanning tunnel microscopy (STM) [1] was developed in 1982, followed by atomic force microscopy (AFM) [
2
] in 1986, as methods to utilize tunneling current between a conductive cantilever tip and a sample surface in order to detect depressions and protuberances on a nanometer sized section of the surface...
Lado Filipovic
,
et al.
A simulator for local anodic oxidation of silicon surfaces
...In this context, atomic force microscope (AFM) systems, invented in 1986 [
1
], can be used as manipulation tools for handling structures, where sub-micron or nanometer scale resolution is imperative...
Cagdas Denizel Onal
,
et al.
Automated 2-D Nanoparticle Manipulation Using Atomic Force Microscopy
...Since its development in 1986 by Binnig et al [
4
], the...
Sebastiano Di Bucchianico
,
et al.
Atomic Force Microscope nanolithography on chromosomes to generate sin...
...AFM can also be used to monitor the fundamental mechanical properties of materials such as adhesive strength, compressibility, and elasticity (
Binnig et al. 1986;
Muller and Dufrene 2008; Noy 2006; Xing et al. 2010)...
Lijin Xia
,
et al.
Characterization of English ivy ( Hedera helix ) adhesion force and im...
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Citations
(2217)
Transmembrane helices can induce domain formation in crowded model membranes
Jan Domański
,
Siewert J. Marrink
,
Lars V. Schäfer
Journal:
Biochimica Et Biophysica Acta-biomembranes - BBA-BIOMEMBRANES
, 2012
Indentation analysis of nano-particle using nano-contact mechanics models during nano-manipulation based on atomic force microscopy
(
Citations: 3
)
Khadijeh DaeinabiMoharam
,
Moharam Habibnejad Korayem
Journal:
Journal of Nanoparticle Research - J NANOPART RES
, vol. 13, no. 3, pp. 1075-1091, 2011
Robust Feedforward-Feedback Control of a Nonlinear and Oscillating 2DOF Piezocantilever
(
Citations: 2
)
Micky Rakotondrabe
,
Kanty Rabenorosoa
,
Joël Agnus
,
Nicolas Chaillet
Journal:
IEEE Transactions Automation Science and Engineering
, vol. 8, no. 3, pp. 506-519, 2011
Trevor's disease (dysplasia epiphysealis hemimelica) located at the hand: Case report and review of the literature
(
Citations: 1
)
A. Gölles
,
P. Stolz
,
J. Freyschmidt
,
R. Schmitt
Journal:
European Journal of Radiology - EUR J RADIOL
, vol. 77, no. 2, pp. 245-248, 2011
A simulator for local anodic oxidation of silicon surfaces
(
Citations: 1
)
Lado Filipovic
,
Hajdin Ceric
,
Johann Cervenka
,
Siegfried Selberherr
Conference:
Canadian Conference on Electrical and Computer Engineering - CCECE
, pp. 000695-000698, 2011