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Characterization of Pr2O3 Added Metals/GaAs Schottky Diodes using X-ray Photoelectron Spectroscopy

Characterization of Pr2O3 Added Metals/GaAs Schottky Diodes using X-ray Photoelectron Spectroscopy,10.1002/(SICI)1521-4079(199909)34:8<1017::AID-CRAT1

Characterization of Pr2O3 Added Metals/GaAs Schottky Diodes using X-ray Photoelectron Spectroscopy  
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Journal: Crystal Research and Technology - CRYST RES TECH , vol. 34, no. 8, pp. 1017-1021, 1999
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