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Fault Tolerant
Monte Carlo Simulation
Threshold Voltage
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Devices and Input Vectors are Shaping von Neumann Multiplexing
Devices and Input Vectors are Shaping von Neumann Multiplexing,10.1109/TNANO.2010.2059036,IEEE Transactions on Nanotechnology,Valeriu Beiu,Walid Ibrah
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Devices and Input Vectors are Shaping von Neumann Multiplexing
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Citations: 2
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Valeriu Beiu
,
Walid Ibrahim
This paper starts by reviewing many of the gatelevel reliability analyses of von Neumann multiplexing (vNMUX). It goes on to detail very accurate devicelevel (CMOS technology specific) analyses of vNMUX with respect to
threshold voltage
variations, taking into account both the gates' topology as well as the input vectors. Such results are essential for a clear understand ing of vNMUX when considering the unreliable behavior of future nanodevices. These analyses should change the "view from the top" as revealing a different picture from the wellknown gatelevel the oretical and simulation results. The findings presented here are also able to explain certain apparently abnormal behaviors of vNMUX reported based on
Monte Carlo
simulations, and should have im plications for the appraisal and the design of future faulttolerant nanoarchitectures.
Journal:
IEEE Transactions on Nanotechnology  IEEE TRANS NANOTECHNOL
, vol. 10, no. 3, pp. 606616, 2011
DOI:
10.1109/TNANO.2010.2059036
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Citation Context
(2)
...devices play on von Neumann multiplexing [
42
] (at very low redundancy factors), and on several full adder cells [43]...
Walid Ibrahim
,
et al.
Using Bayesian Networks to Accurately Calculate the Reliability of Com...
...In [
25
] we have used for the first time an analytical device level approach to study in details the effects vNMUX schemes at the minimum RF play on enhancing reliability over the NAND2 and MAJ3 elementary gates...
...Although a wealth of papers reporting performance analyses of vNMUX have been published [26][34], the analysis in [
25
] was the first one to consider the devices' probabilities of failure (PF DEV), the gates' topologies, and the input vectors to accurately analyze the performance of vNMUX schemes...
...The simulation results reported in [
25
] have shown that MAJ3 vNMUX at RF = 6 outperforms NAND2 vNMUX at RF = 9 by a reliability improvement index (RII, see eq. (9) later) of only 2, i.e., MAJ 3 vNMUX is only twice more reliable than NAND2 vN MUX at the minimum RF•...
Walid Ibrahim
,
et al.
On NOR2 von Neumann multiplexing
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Citations
(2)
Using Bayesian Networks to Accurately Calculate the Reliability of Complementary Metal Oxide Semiconductor Gates
Walid Ibrahim
,
Valeriu Beiu
Journal:
IEEE Transactions on Reliability  TR
, vol. 60, no. 3, pp. 538549, 2011
On NOR2 von Neumann multiplexing
Walid Ibrahim
,
Valeriu Beiu
,
Azam Beg
Conference:
International Design and Test Workshop  IDT
, 2010