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Dynamic defect localization using FPGA to monitor digital values

Dynamic defect localization using FPGA to monitor digital values,10.1016/j.microrel.2011.06.064,Microelectronics Reliability,L. Saury,S. Cany

Dynamic defect localization using FPGA to monitor digital values  
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Fault localization is a key step of the failure analysis flow on defective ICs. Recently, the development of parametric variation mapping (xVM) under dynamic laser stimulation has considerably increased the scope of soft defect localization.In this paper, we are presenting a FPGA-based real-time acquisition and processing unit for the variation mapping of a digital data. The FPGA-based solution is described and used on a real case of defective analog-to-digital converter (ADC). The advantages of our system are listed and future developments are considered.
Journal: Microelectronics Reliability , vol. 51, no. 9, pp. 1701-1704, 2011
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