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Quantification and minimization of disorder caused by focused electron beam induced deposition of cobalt on graphene

Quantification and minimization of disorder caused by focused electron beam induced deposition of cobalt on graphene,10.1016/j.mee.2010.12.002,Microel

Quantification and minimization of disorder caused by focused electron beam induced deposition of cobalt on graphene  
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Graphene has attracted a lot of attention due to its unique transport properties, including applications in Spintronics. Therefore, one of the key issues is the investigation of the spin polarized transport phenomena, which requires the use of magnetic contacts for electrical measurements. Here we present results of the micro-Raman spectroscopy and in situ transport measurements during the electron beam irradiation and electron beam induced deposition of metallic Co on graphene. We aim to understand the effects caused by the Co deposition on the graphene in order to minimize undesired deterioration and induced disorder. Annealing procedures have been also carried out to recover the initial graphene properties.
Journal: Microelectronic Engineering - MICROELECTRON ENG , vol. 88, no. 8, pp. 2063-2065, 2011
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