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Automatic Verification
False Alarm Rate
Local Features
Error Rate
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Elimination of skilled forgeries in off-line systems: a breakthrough
Elimination of skilled forgeries in off-line systems: a breakthrough,10.1109/ICPR.1992.201806,M. Ammar
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Elimination of skilled forgeries in off-line systems: a breakthrough
(
Citations: 2
)
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M. Ammar
Presents a novel approach to
automatic verification
of signatures in off-line systems. This new approach is able to eliminate skilled forgeries at a very low false alarm rate. A zero
false alarm rate
is also possible at a very high correct rejection, and the average
error rate
has approached 2% for skilled forgeries. The new approach is based on matching the suspect signature with reference knowledge (RN) represented by a reference image (RI) constructed from all the available training samples. A set of newly developed global and local features, extracted using a new matching technique called Ammar matching technique (AMT), are used
Conference:
International Conference on Pattern Recognition - ICPR
, 1992
DOI:
10.1109/ICPR.1992.201806
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References
(12)
Thin films for solar control applications
(
Citations: 4
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Journal:
Proceedings of The Royal Society A: Mathematical, Physical and Engineering Sciences
, vol. 466, no. 2113, pp. 19-44, 2009
Photochromism induced in an electrolytically pretreated MoO3 thin film by visible light
(
Citations: 39
)
J. N. Yao
,
K. Hashimoto
,
A. Fujishima
Journal:
Nature
, vol. 355, no. 6361, pp. 624-626, 1992
Thermally irreversible organic photochromic compounds for optical memory
(
Citations: 6
)
V. A. Barachevsky
,
Yu. P. Strokach
,
Yu. A. Puankov
,
M. M. Krayushkin
Journal:
Journal of Physical Organic Chemistry - J PHYS ORG CHEM
, vol. 20, no. 11, pp. 1007-1020, 2007
Photochromism in WO 3 thin films
(
Citations: 12
)
A. I Gavrilyuk
Journal:
Electrochimica Acta - ELECTROCHIM ACTA
, vol. 44, no. 18, pp. 3027-3037, 1999
Photochromism of molybdenum oxide
(
Citations: 13
)
Tao He
,
Jiannian Yao
Journal:
Journal of Photochemistry and Photobiology C-photochemistry Reviews - J PHOTOCHEM PHOTOBIOL C-PHOTO
, vol. 4, no. 2, pp. 125-143, 2003
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Citations
(2)
Fuzzy Modeling Based Signature Verification System
(
Citations: 9
)
Madasu Hanmandlu
,
K. R. Murali Mohan
,
Sourav Chakraborty
,
Gaurav Garg II
Conference:
International Conference on Document Analysis and Recognition - ICDAR
, 2001
Automatic Signature Verification: The State of the Art - 1989-1993
(
Citations: 164
)
Franck Leclerc
,
Rejean Plamondon
Journal:
International Journal of Pattern Recognition and Artificial Intelligence - IJPRAI
, vol. 8, no. 3, pp. 643-660, 1994