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Keywords
(6)
Active Region
Electroluminesce...
Low Energy
Transmission Electron Microscopy
High Resolution X Ray Diffraction
Quantum Cascade
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SiGe/Si quantum cascade structures deposited by low-energy plasma-enhanced CVD
SiGe/Si quantum cascade structures deposited by low-energy plasma-enhanced CVD,10.1109/GROUP4.2008.4638086,G. Isella,G. Matmon,A. Neels,E. Muller,M. C
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SiGe/Si quantum cascade structures deposited by low-energy plasma-enhanced CVD
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G. Isella
,
G. Matmon
,
A. Neels
,
E. Muller
,
M. Califano
,
D. Chrastina
,
H. von Kanel
,
L. Lever
,
Z. Ikonic
,
R. W. Kelsall
,
D. J. Paul
Si0.5Ge0.5/Si
quantum cascade
structures have been deposited by low-energy plasma-enhanced CVD according to a bound-to-continuum design and characterized by
high resolution
x-ray diffraction and transmission electron microscopy.
Electroluminescence
from the
active region
is peaked around 2.5 THz (~10 meV) and exhibits Stark shift and polarization dependence.
Conference:
IEEE International Conference on Group IV Photonics - GFP
, 2008
DOI:
10.1109/GROUP4.2008.4638086
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)
References
(12)
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Journal:
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,
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,
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Journal:
Nature
, vol. 417, no. 6885, pp. 156-159, 2002
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(
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Journal:
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, vol. 16, no. 5, 2008
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(
Citations: 46
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