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Dynamic-Adaptive Field Induced Charged Device Model (FICDM) compact tester model

Dynamic-Adaptive Field Induced Charged Device Model (FICDM) compact tester model,10.1109/ICSICT.2008.4734570,Thorsten Weyl,Dave Clarke,Karl Rinne

Dynamic-Adaptive Field Induced Charged Device Model (FICDM) compact tester model   (Citations: 3)
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This paper introduces a compact FICDM tester model that includes all prominent tester parasitics and discharge arc behaviours. Geometry variations between different Devices Under Test (DUTs) and associated changes in tester capacitances are accounted for. The variation of ground plane capacitances during the approach of the pogo pin towards the DUT and prior to discharge are also modeled. The tester model was verified across an extensive range of test voltages and DUT capacitances.
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