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Keywords
(7)
Electromagnetic Field
Fault Injection
Power Analysis
Power Consumption
Power Supply
Radio Frequency Identification
Rfid Tag
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Contact-based fault injections and power analysis on RFID tags
Contact-based fault injections and power analysis on RFID tags,10.1109/ECCTD.2009.5275012,Michael Hutter,J.-M. Schmidt,T. Plos
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Contact-based fault injections and power analysis on RFID tags
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Citations: 2
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Michael Hutter
,
J.-M. Schmidt
,
T. Plos
In the last decade, many articles have been published that demonstrate the susceptibility of cryptographic devices against implementation attacks. Usually, such devices draw their energy from a contact-based power supply. This power-supply connection is often exploited to extract the secret key by applying fault-injection methods and power-analysis attacks. In this article, we present implementation attacks on
Radio Frequency Identification
(RFID) tags which are usually powered contactlessly by an electromagnetic field. We describe a contact-based measurement setup that allows both injection of faults and measuring of the
power consumption
of passive RFID tags. Furthermore, we demonstrate the applicability of our setup by providing practical results of attacks on commercially available HF and UHF RFID tags. The results have led us to the conclusion that RFID tags are as susceptible to such attacks as contact-based powered devices. Appropriate countermeasures are needed to thwart these attacks.
Conference:
European Conference on Circuit Theory and Design - ECCTD
, 2009
DOI:
10.1109/ECCTD.2009.5275012
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Citation Context
(1)
...HWIFI has been accomplished by stressing the actual hardware with environmental parameters; Such as pin-level fault injection [4], power supply disturbance [
5
], laser based fault injection [6] and Electro-Migration Interference (EMI) [7]...
Alireza Rohani
,
et al.
A Technique for Accelerating Injection of Transient Faults in Complex ...
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Citations
(2)
A Technique for Accelerating Injection of Transient Faults in Complex SoCs
(
Citations: 1
)
Alireza Rohani
,
Hans G. Kerkhoff
Journal:
IEEE Journal of Solid-state Circuits - IEEE J SOLID-STATE CIRCUITS
, 2011
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