Academic
Publications
Total Dose and Single Event Testing of a Hardened Point of Load Regulator

Total Dose and Single Event Testing of a Hardened Point of Load Regulator,10.1109/REDW.2010.5619501,N. W. van Vonno,L. G. Pearce,J. S. Gill,H. W. Satt

Total Dose and Single Event Testing of a Hardened Point of Load Regulator   (Citations: 3)
BibTex | RIS | RefWorks Download
We report the results of total dose and single-event effects testing of the ISL70001SRH hardened point of load (POL) voltage regulator and discuss part design, performance and applications. The part is implemented in a submicron BiCMOS process and uses integrated power MOSFET switching transistors.
Conference: IEEE Radiation Effects Data Workshop - REDW , pp. 8-8, 2010
Cumulative Annual
View Publication
The following links allow you to view full publications. These links are maintained by other sources not affiliated with Microsoft Academic Search.
Sort by: