Manufacturing defects in nanoscale tech- nologies have highly complex timing behaviour that is also aected by process variations. While conventional wisdom suggests that it is optimal to detect a delay defect through the longest sensitisable path, non-trivial defect behaviour along with modelling inaccuracies necessitate consideration of paths of well-controlled length during test generation. We present a generic methodology that yields tests through all sensitisable paths of user-specied length. The resulting tests can be employed within the framework of adaptive testing. The methodology is based on encoding the problem as a Boolean-satisabi lity (SAT) instance and thereby leverages recent advances in SAT-solving technology.